# XAFS spectrum of Silicon https://mdr.nims.go.jp/datasets/59829434-1a17-442d-ba69-2f9bf51aeb1d ## Files - [19060503.dat](https://mdr.nims.go.jp/filesets/b2105542-c8a3-4956-9f41-76cd490edfb7/download) ([Detail](https://mdr.nims.go.jp/filesets/b2105542-c8a3-4956-9f41-76cd490edfb7.md)) - [19060503.pfy](https://mdr.nims.go.jp/filesets/06fd2225-67e8-41c9-8a39-102c6ccca780/download) ([Detail](https://mdr.nims.go.jp/filesets/06fd2225-67e8-41c9-8a39-102c6ccca780.md)) - [19060503.tey](https://mdr.nims.go.jp/filesets/8aaa0421-81ab-4c5a-ba1f-8cf59ec07892/download) ([Detail](https://mdr.nims.go.jp/filesets/8aaa0421-81ab-4c5a-ba1f-8cf59ec07892.md)) - [metadata.json](https://mdr.nims.go.jp/filesets/34c34767-172d-4165-8ebe-17a1d4fc28e8/download) ([Detail](https://mdr.nims.go.jp/filesets/34c34767-172d-4165-8ebe-17a1d4fc28e8.md)) - [metadata.yml](https://mdr.nims.go.jp/filesets/ef077d61-4c76-4d15-ab35-f71ac2572701/download) ([Detail](https://mdr.nims.go.jp/filesets/ef077d61-4c76-4d15-ab35-f71ac2572701.md)) - [primary.tsv](https://mdr.nims.go.jp/filesets/22816e59-8837-4521-8ed3-40850ccd4b32/download) ([Detail](https://mdr.nims.go.jp/filesets/22816e59-8837-4521-8ed3-40850ccd4b32.md)) - [BL10_Si-K_003_pfy.png](https://mdr.nims.go.jp/filesets/4463bc41-832c-4cf4-a52b-e15fab6a9869/download) ([Detail](https://mdr.nims.go.jp/filesets/4463bc41-832c-4cf4-a52b-e15fab6a9869.md)) - [BL10_Si-K_003_tey.png](https://mdr.nims.go.jp/filesets/052fcbf5-4b3e-4d79-8de0-2cfec6a2e1fc/download) ([Detail](https://mdr.nims.go.jp/filesets/052fcbf5-4b3e-4d79-8de0-2cfec6a2e1fc.md)) ## Id 59829434-1a17-442d-ba69-2f9bf51aeb1d ## Local identifier identifier: Ritsu_MDR_20220603/mdr-bp0004-0000045 ## Visibility open_to_public ## State published ## Created at 2022-03-28T11:22:25.223103Z ## Updated at 2025-05-02T12:46:28.405870Z ## Published at 2022-06-10T13:40:52.335626Z ## Doi https://doi.org/10.48505/nims.3327 ## First published url https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/ ## Date published ## Recorded date published ## Resource type dataset ## Manuscript type na ## Collection - id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54 title: MDR XAFS DB ## Title - title: XAFS spectrum of Silicon title_type: original lang: en ## Description - description: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon measured at Ritsumeikan-SR BL-10, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR description_type: abstract lang: en ## Creator - name: Masashi Ishii role: editor orcid: https://orcid.org/0000-0003-0357-2832 organization: National Institute for Materials Science - name: Ritsumeikan SR Center role: author organization: Ritsumeikan University ror: https://ror.org/0197nmd03 ## Contact agent - name: Ritsumeikan SR Center organization: Ritsumeikan University ## Publisher organization: Ritsumeikan University ## Managing organization ## Keyword - subject: Silicon (powder) schema: not_defined - subject: Si schema: not_defined - subject: Si K-edge schema: not_defined - subject: Pure metal schema: not_defined - subject: BL-10 schema: not_defined - subject: Ritsumeikan-SR schema: not_defined - subject: XAFS schema: not_defined - subject: collection - MDR XAFS DB schema: not_defined - subject: Silicon schema: not_defined - subject: Pure metalloid schema: not_defined ## Rights - description: Creative Commons BY Attribution 4.0 International identifier: https://creativecommons.org/licenses/by/4.0/ date_licensed: 2025-05-01 ## Other identifier(s) ## Data origin - data_origin_type: experiment ## Embargo ## Journal ## Conference ## Related item ## Funding ## Instrument - name: BL-10_XAFS description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup manufacturer: Ritsumeikan SR Center function_description: x-ray absorption spectroscopy ## Instrument operator ## Instrument managing organization - organization: Ritsumeikan University department: Ritsumeikan SR Center ror: '0197nmd03' ## Measurement method - category_vocabulary: http://matvoc.nims.go.jp/entity/Q386 category_description: x-ray absorption spectroscopy analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30 analysis_field_description: spectroscopy description: TEY measured_at: '2019-06-05T06:24:11Z' - category_vocabulary: http://matvoc.nims.go.jp/entity/Q386 category_description: x-ray absorption spectroscopy analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30 analysis_field_description: spectroscopy description: PFY measured_at: '2019-06-05T06:24:11Z' ## Specimen - name: Silicon description: powder (325mesh), on carbon tape material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q5244 material_type_description: Pure metalloid ## Chemical composition - identifier: 7440-21-3 category_vocabulary: http://matvoc.nims.go.jp/entity/Q2366 ## Structure for specimen ## Structural feature for specimen - category_vocabulary: http://matvoc.nims.go.jp/entity/Q686 category_description: local structure description: Geometrical and electronic local structure around the absorption element ## Specific property for specimen ## Process for specimen treatment ## Computational method ## Energy level/transition state - category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501 description: Si K-edge ## Software ## Custom property ## Fileset - id: b2105542-c8a3-4956-9f41-76cd490edfb7 filename: 19060503.dat content_type: application/octet-stream size: 37114 md5: 4a98a02361878c54f82ebedb745037a8 - id: 06fd2225-67e8-41c9-8a39-102c6ccca780 filename: 19060503.pfy content_type: application/octet-stream size: 5243 md5: f1ea35728d1649c562356b292044860f - id: 8aaa0421-81ab-4c5a-ba1f-8cf59ec07892 filename: 19060503.tey content_type: application/octet-stream size: 5276 md5: 20df03a52bc9913c67811ccf7363d140 - id: 34c34767-172d-4165-8ebe-17a1d4fc28e8 filename: metadata.json content_type: application/json size: 15630 md5: fc8e89fbef620820a09026dabb8d5b4c - id: ef077d61-4c76-4d15-ab35-f71ac2572701 filename: metadata.yml content_type: application/octet-stream size: 8196 md5: '0235925d9418224dc37b9d72d97b1d5e' - id: 22816e59-8837-4521-8ed3-40850ccd4b32 filename: primary.tsv content_type: text/tab-separated-values size: 14665 md5: a712a67f383a376440afe41b99099b7e - id: 4463bc41-832c-4cf4-a52b-e15fab6a9869 filename: BL10_Si-K_003_pfy.png content_type: image/png size: 20304 md5: 7856bf10d00add02526e633812239825 - id: 052fcbf5-4b3e-4d79-8de0-2cfec6a2e1fc filename: BL10_Si-K_003_tey.png content_type: image/png size: 21534 md5: 13a5b64f4de9423ac38bfb883e65b6d0 ## Thumbnail fileset_id: 052fcbf5-4b3e-4d79-8de0-2cfec6a2e1fc filename: BL10_Si-K_003_tey.png