# Temperature- and depth-dependent valence band electronic structures of half-metallic                    <math>                      <mrow>                        <msub>                          <mi>Co</mi>                          <mn>2</mn>                        </msub>                        <mi>MnSi</mi>                      </mrow>                    </math>                    studied by hard x-ray photoemission spectroscopy

https://mdr.nims.go.jp/datasets/57126d80-ab4b-46cb-a385-ff54106ee767

## File

- [CMS_VT_VP_HAXPES_final.pdf](https://mdr.nims.go.jp/filesets/50e88c06-188b-4254-bfaa-7625840d7f68/download) ([Detail](https://mdr.nims.go.jp/filesets/50e88c06-188b-4254-bfaa-7625840d7f68.md))
- [SM_CMS_VT_VP_HAXPES_v5.pdf](https://mdr.nims.go.jp/filesets/b765b274-0c4a-4f3d-ab27-207b092b49d3/download) ([Detail](https://mdr.nims.go.jp/filesets/b765b274-0c4a-4f3d-ab27-207b092b49d3.md))

## Id

57126d80-ab4b-46cb-a385-ff54106ee767

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-02-20T05:16:46.313220Z

## Updated at

2026-02-20T23:30:04.145260Z

## Published at

2026-02-20T08:56:41.553980Z

## Doi

https://doi.org/10.48505/nims.6189

## First published url

https://doi.org/10.1103/9yd3-16w6

## Date published

2026-02-18

## Recorded date published

2026-2

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: |-
    Temperature- and depth-dependent valence band electronic structures of half-metallic
                        <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML">
                          <mml:mrow>
                            <mml:msub>
                              <mml:mi>Co</mml:mi>
                              <mml:mn>2</mml:mn>
                            </mml:msub>
                            <mml:mi>MnSi</mml:mi>
                          </mml:mrow>
                        </mml:math>
                        studied by hard x-ray photoemission spectroscopy
  title_type: original
  lang: en

## Description

- description: We used hard‑X‑ray photoelectron spectroscopy with x-ray total‑reflection
    and magnetic‑circular‑dichroism to study the temperature‑ and depth‑dependent
    valence‑band electronic and magnetic states of an AlOx-capped Co2MnSi thin film.
    Measurements at 20–300 K show clear temperature‑dependent changes in both bulk
    and near‑interface regions, but the spectral and magnetic evolutions differ between
    the two depths. The bulk spectra match disordered‑local‑moment calculations, underscoring
    spin‑fluctuation effects, while the interface exhibits enhanced spin fluctuations.
    This demonstrates the importance of non‑destructive, depth‑resolved probing of
    insulator/ferromagnet heterojunctions.
  description_type: abstract
  lang: und

## Creator

- name: Shigenori Ueda
  role: author
  orcid: https://orcid.org/0000-0001-9425-0614
- name: Yuichi Fujita
  role: author
  orcid: https://orcid.org/0000-0002-1798-1066
- name: Ivan Kurniawan
  role: author
  orcid: https://orcid.org/0000-0001-5419-0047
- name: Yuya Sakuraba
  role: author
  orcid: https://orcid.org/0000-0003-4618-9550
- name: Yoshio Miura
  role: author
  orcid: https://orcid.org/0000-0002-5605-5452

## Contact agent



## Publisher

organization: American Physical Society (APS)

## Managing organization



## Keyword

- subject: Co2MnSi
  schema: not_defined
- subject: HAXPES
  schema: not_defined
- subject: Temperature dependence
  schema: not_defined
- subject: Interface and bulk electronic states
  schema: not_defined
- subject: interface and bulk magnetic properties
  schema: not_defined
- subject: X-ray polarization dependence
  schema: not_defined

## Rights

- description: "©2026 American Physical Society"
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin



## Embargo



## Journal

- title: Physical Review B
  issn: '24699950'
  volume: '113'
  issue: '6'
  article_number: '064430'

## Conference



## Related item



## Funding

- identifier: JPMXP0112101001
  funder_name: Ministry of Education, Culture, Sports, Science and Technology
- identifier: JPMXP1122683430
  funder_name: Ministry of Education, Culture, Sports, Science and Technology
- identifier: JPMXP1122715503
  funder_name: Ministry of Education, Culture, Sports, Science and Technology
- identifier: 20K05336
  funder_name: Japan Society for the Promotion of Science
- identifier: 17H06152
  funder_name: Japan Society for the Promotion of Science

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 50e88c06-188b-4254-bfaa-7625840d7f68
  filename: CMS_VT_VP_HAXPES_final.pdf
  content_type: application/pdf
  size: 2867567
  md5: 87dfed3dbd98e78a5bb7b6feffff30b4
- id: b765b274-0c4a-4f3d-ab27-207b092b49d3
  filename: SM_CMS_VT_VP_HAXPES_v5.pdf
  content_type: application/pdf
  size: 1706071
  md5: df703a4a1acce016aee3a7f27db1c5a3

## Thumbnail

fileset_id: b765b274-0c4a-4f3d-ab27-207b092b49d3
filename: SM_CMS_VT_VP_HAXPES_v5.pdf