Takahisa Ohno
(National Institute for Materials Science
)
;
Nobuo Tajima
(National Institute for Materials Science
)
;
Jun Nara
(National Institute for Materials Science
)
説明:
(abstract)To utilize graphene as an electronic device graphene has to be brought into contact with a metal electrode and the metal contact has a significant impact on the characteristics of the device. We have investigated the potential profile induced in graphene layer by metal contacts, which describes how charges are redistributed between metal and graphene in order to eliminate the difference in work function between them, by using firstprinciples calculations. It is found that the potential profiles are much different between surface and edge contact metal/graphene junctions. For surface contacts the potential profile is significantly influenced by Pauli exclusion interactions and bond formation between metal and graphene. On the other hand, the edge contacts lack Pauli exclusion interactions and the non-graphene-like metallic states of C atoms near the metal edges, which are induced by bond formation, are suggested to have a major effect on eliminating the work function difference.
権利情報:
© 2024 The Japan Society of Applied Physics
This is an author-created, un-copyedited version of an article accepted for publication/published
in Japanese Journal of Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.35848/1347-4065/ad3ed2.
キーワード: Graphene
刊行年月日: 2024-05-01
出版者: IOP Publishing
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4710
公開URL: https://doi.org/10.35848/1347-4065/ad3ed2
関連資料:
その他の識別子:
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更新時刻: 2025-05-17 08:30:23 +0900
MDRでの公開時刻: 2025-05-17 08:20:48 +0900
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