# Assessing degradation in perovskite solar cells via thermal hysteresis of photocurrent and device simulation

https://mdr.nims.go.jp/datasets/51fd121d-086a-4747-a2d2-da1011e0f126

## File

- [Manuscript Authors Version.pdf](https://mdr.nims.go.jp/filesets/0c92e962-8716-49eb-a6c1-0a6afb163e37/download) ([Detail](https://mdr.nims.go.jp/filesets/0c92e962-8716-49eb-a6c1-0a6afb163e37.md))
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## Id

51fd121d-086a-4747-a2d2-da1011e0f126

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-12-05T02:43:00.532092Z

## Updated at

2024-12-06T08:17:44.616918Z

## Published at

2024-12-06T08:17:44.727780Z

## Doi

https://doi.org/10.48505/nims.5099

## First published url

https://doi.org/10.1016/j.solmat.2024.113319

## Date published

2024-11-28

## Recorded date published

2025-3

## Resource type

journal_article

## Manuscript type

authors_original

## Collection



## Title

- title: Assessing degradation in perovskite solar cells via thermal hysteresis of
    photocurrent and device simulation
  title_type: original
  lang: en

## Description

- description: Understanding the degradation mechanisms of perovskite solar cell (PSC)
    is paramount to addressing stability-related issues. Photocurrent loss is widely
    observed in the degraded PSC. Here, we investigate the degradation of PSC by probing
    the thermal hysteresis of photocurrent (THPC) and the dynamics of thermally active
    ionic or recombination processes. Degraded devices exhibit a considerably higher
    degree of variation in the photogenerated current, encompassing a broad spectrum
    of photo-induced ionic charge accumulation. THPC reveals changes driven by the
    accumulation of interfacial ionic charges and active defects under photo-thermal
    drifting, as supported by capacitance analysis. Device simulation corroborates
    that the interfacial surface defect formed at the interfacial layer in the device
    structure wields a substantial influence on device degradation, particularly in
    cases of photocurrent loss. This study underscores the direct correlation between
    the degradation of PSC and the presence of thermally activated traps and interfacial
    charge accumulation emphasizing the importance of passivating these pathways to
    improve device stability.
  description_type: abstract
  lang: und

## Creator

- name: Dhruba B. Khadka
  role: author
  orcid: https://orcid.org/0000-0001-9134-3890
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Masatoshi Yanagida
  role: author
  orcid: https://orcid.org/0000-0002-8065-7875
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Yasuhiro Shirai
  role: author
  orcid: https://orcid.org/0000-0003-2164-5468
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: Elsevier BV

## Managing organization



## Keyword

- subject: Perovskite degradation
  schema: not_defined
- subject: Interfacial defect
  schema: not_defined
- subject: " thermal hysteresis of photocurrent"
  schema: not_defined
- subject: Capacitance spectra
  schema: not_defined
- subject: SCAPS simulation
  schema: not_defined
- subject: Ion migration
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Solar Energy Materials and Solar Cells
  issn: '09270248'
  volume: '281'
  article_number: '113319'

## Conference



## Related item



## Funding

- identifier: '1572'
  funder_name: Kurata Memorial Hitachi Science and Technology Foundation

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Fileset

- id: 0c92e962-8716-49eb-a6c1-0a6afb163e37
  filename: Manuscript Authors Version.pdf
  content_type: application/pdf
  size: 1344229
  md5: 4dc58fc0bbc13fd7af58fa8a89c71671
- id: f913de1f-5814-46ad-9cd0-904afee9bfb4
  filename: 3_SI-revision-R2.docx
  content_type: application/vnd.openxmlformats-officedocument.wordprocessingml.document
  size: 845605
  md5: e22f3c4525dd58346253a6d803ca92e8

## Thumbnail

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filename: 3_SI-revision-R2.docx