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コレクション

Research Highlights

引用

説明:

Scanning tunnelling microscopy imaging under differing magnetic fields gives fundamental insights into the behavior of supercurrents and vortices on the surface of indium-doped silicon films.

権利情報:

• In Copyright
  In Copyright

キーワード: surface, atomic layer, superconductor, vortex, Josephson junction, atomic step, scanning tunneling microscopy, indium, silicon

刊行年月日: 2015-02-27

出版者: National Institute for Materials Science

掲載誌:

• MANA E-BULLETIN vol. 19

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI: https://doi.org/10.48505/nims.3759

公開URL: https://www.nims.go.jp/mana/research/highlights/vol19.html

関連資料:

• refers
• (dataset)
• https://doi.org/10.1103/PhysRevLett.113.247004

その他の識別子:

連絡先:

更新時刻: 2023-12-25 00:30:17 +0900

MDRでの公開時刻: 2022-12-16 14:09:39 +0900