# XAFS spectrum of Vanadium silicide

https://mdr.nims.go.jp/datasets/510c5022-b36f-44de-967e-5e1787a7b59f

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/0b552deb-14ef-4f82-90ac-ed3e37e66ef7/download) ([Detail](https://mdr.nims.go.jp/filesets/0b552deb-14ef-4f82-90ac-ed3e37e66ef7.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/a448dcac-1cf2-42ea-b7e4-89d8a4024be8/download) ([Detail](https://mdr.nims.go.jp/filesets/a448dcac-1cf2-42ea-b7e4-89d8a4024be8.md))
- [V-K_VSi2_Si111_100ms_180211.dat](https://mdr.nims.go.jp/filesets/2d62aee8-2133-484b-9e9b-c3d99cc6dc96/download) ([Detail](https://mdr.nims.go.jp/filesets/2d62aee8-2133-484b-9e9b-c3d99cc6dc96.md))
- [V-K_VSi2_Si111_100ms_180211.ex3](https://mdr.nims.go.jp/filesets/82a38698-1260-4c11-b08a-178184916f63/download) ([Detail](https://mdr.nims.go.jp/filesets/82a38698-1260-4c11-b08a-178184916f63.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/6f14441f-e531-401c-b5b2-bac5807efa2c/download) ([Detail](https://mdr.nims.go.jp/filesets/6f14441f-e531-401c-b5b2-bac5807efa2c.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/04e3fc0c-0167-446c-9fcd-ad397e49c154/download) ([Detail](https://mdr.nims.go.jp/filesets/04e3fc0c-0167-446c-9fcd-ad397e49c154.md))
- [VSi2.thumb.png](https://mdr.nims.go.jp/filesets/46a92685-5835-4c79-9945-590729974730/download) ([Detail](https://mdr.nims.go.jp/filesets/46a92685-5835-4c79-9945-590729974730.md))
- [V-K_VSi2_Si111_100ms_180211.txt](https://mdr.nims.go.jp/filesets/37ca3ce5-0648-48f8-9bc6-eeed4f5c95ed/download) ([Detail](https://mdr.nims.go.jp/filesets/37ca3ce5-0648-48f8-9bc6-eeed4f5c95ed.md))

## Id

510c5022-b36f-44de-967e-5e1787a7b59f

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:22:03.921622Z

## Updated at

2025-05-02T12:45:32.183765Z

## Published at

2021-08-12T16:08:38.427572Z

## Doi

https://doi.org/10.48505/nims.2482

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-24

## Recorded date published

24/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Vanadium silicide
  title_type: original
  lang: en
- title: spring8.d487b335-6900-4a13-83ac-f5df685a9821
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at V K-edge of Vanadium silicide measured at SPring-8 BL14B2, and is a part of
    XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: VSi2
  schema: not_defined
- subject: V K-edge
  schema: not_defined
- subject: Silicide
  schema: not_defined
- subject: Vanadium silicide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2018-02-11T10:08:00Z'

## Specimen

- name: Vanadium silicide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q744
  material_type_description: Silicide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1760

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2510
  description: V K-edge

## Software



## Custom property



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## Thumbnail

fileset_id: 46a92685-5835-4c79-9945-590729974730
filename: VSi2.thumb.png