@article{gueye,
  title = {Study of Local Band Bending in <i>n</i>-Channel In<sub>2</sub>O<sub>3</sub> Thin-Film Transistors under Gate and Drain Voltage Stress Using <i>Operando</i> Hard X-ray Photoelectron Spectroscopy},
  author = {Ibrahima Gueye, Akira Yasui, Yasumasa Takagi, Atsushi Ogura, Osami Sakata, Takahiro Nagata},
  publisher = {American Chemical Society (ACS)},
  year = {2025},
  keywords = {hard X-ray photoelectron spectroscopy, Indium oxide, operando, oxide thin-film transistor, oxide semiconductor}
}