# Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

https://mdr.nims.go.jp/datasets/4efe4ac5-1fe6-4400-b84b-9965ea742f72

## File

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## Id

4efe4ac5-1fe6-4400-b84b-9965ea742f72

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-03-26T09:44:13.029731Z

## Updated at

2024-04-02T07:30:27.142881Z

## Published at

2024-04-02T07:30:27.246705Z

## Doi



## First published url

https://doi.org/10.3390/ma17030578

## Date published

2024-01-25

## Recorded date published



## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Quantitative Characterization by Transmission Electron Microscopy and Its
    Application to Interfacial Phenomena in Crystalline Materials
  title_type: original
  lang: en

## Description

- description: This paper reviews quantitative characterization via transmission electron
    microscopy (TEM) and its application to interfacial phenomena based on the results
    obtained through the studies. Several signals generated by the interaction between
    the specimen and the electron beam with a probe size of less than 1 nm are utilized
    for a quantitative analysis, which yields considerable chemical and physical information.
    This review describes several phenomena near the interfaces, e.g., clear solid–vapor
    interface (surface) segregation of yttria in the zirconia nanoparticles by an
    energy-dispersive X-ray spectroscopy analysis, the evaluation of the local magnetic
    moment at the grain boundary in terms of electron energy loss spectroscopy equipped
    with TEM, and grain boundary character dependence of the magnetism. The direct
    measurement of the stress to the dislocation transferred across the grain boundary
    and the microstructure evolution focused on the grain boundary formation caused
    by plastic deformation are discussed as examples of material dynamics associated
    with the grain boundary. Finally, the outlook for future investigations of interface
    studies, including the recent progress, is also discussed.
  description_type: abstract
  lang: und

## Creator

- name: Seiichiro Ii
  role: author
  orcid: https://orcid.org/0000-0003-3999-384X
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: MDPI AG

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## Keyword

- subject: transmission electron microscopy
  schema: not_defined
- subject: energy dispersive X-ray spectroscopy
  schema: not_defined
- subject: electron energy loss spectroscopy
  schema: not_defined
- subject: grain boundary
  schema: not_defined
- subject: interphase boundary
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Materials
  issn: '19961944'
  volume: '17'
  issue: '3'
  start_page: 578
  article_number: '578'

## Conference



## Related item



## Funding

- identifier: '19106013'
  funder_name: JSPS KAKENHI
- identifier: 16H06366
  funder_name: JSPS KAKENHI
- identifier: 22H01760
  funder_name: JSPS KAKENHI
- identifier: 23K04365
  funder_name: JSPS KAKENHI

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## Fileset

- id: 07b6aa6f-1ac3-40f7-a800-736d2e0db371
  filename: materials-17-00578.pdf
  content_type: application/pdf
  size: 13967100
  md5: 5b33d5dab938e7ea9706286f0bf87b04

## Thumbnail

fileset_id: 07b6aa6f-1ac3-40f7-a800-736d2e0db371
filename: materials-17-00578.pdf