# Automated analysis of photoelectron yield spectroscopy spectra interpreted via power laws

https://mdr.nims.go.jp/datasets/4decbdf0-19b4-4be8-8b80-f2699fa4b5d7

## File

- [Supplemental_material.pdf](https://mdr.nims.go.jp/filesets/f6f9f37b-fd7a-460b-9491-b0a40edc15be/download) ([Detail](https://mdr.nims.go.jp/filesets/f6f9f37b-fd7a-460b-9491-b0a40edc15be.md))
- [Automated analysis of photoelectron yield spectroscopy spectra interpreted via power laws.pdf](https://mdr.nims.go.jp/filesets/a551dd2a-0673-423d-a0be-0c63494ea7e6/download) ([Detail](https://mdr.nims.go.jp/filesets/a551dd2a-0673-423d-a0be-0c63494ea7e6.md))

## Id

4decbdf0-19b4-4be8-8b80-f2699fa4b5d7

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-04-24T23:08:09.077732Z

## Updated at

2025-04-25T03:30:08.442547Z

## Published at

2025-04-25T03:19:14.543417Z

## Doi



## First published url

https://doi.org/10.1080/27660400.2025.2465257

## Date published

2025-12-31

## Recorded date published

2025-12-31

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Automated analysis of photoelectron yield spectroscopy spectra interpreted
    via power laws
  title_type: original
  lang: en

## Description

- description: We propose an automated method for threshold analysis in photoelectron
    yield spectroscopy (PYS), a technique used for measuring the ionization energy
    of inorganic and organic semiconductors. PYS spectra can be interpreted using
    the power law. First, the analysis region, the region of interest (ROI), within
    the measured spectrum must be identified and isolated for power law interpretation.
    Segment regression is employed to estimate the change point of the spectrum and
    slope on either side. The ROI is extracted using an algorithm that accounts for
    the slope variation (PW-ROI method). The inverse of the power number (n) derived
    from the physical model is then applied to the spectrum, and fitting is performed
    using the mean absolute error as the minimization function with the extended rectified
    linear unit function (1/n plot method). In cases with multiple candidate models,
    the optimal model is chosen based on the coefficient of determination using the
    1/n plot method. This automated analysis method significantly reduces the processing
    time and ensures that the values are objective and human independent. Results
    of automated analysis closely align with those of manual analysis, with their
    differences limited within the range of ±0.1 eV.
  description_type: abstract
  lang: und

## Creator

- name: Shinjiro Yagyu
  role: author
  orcid: https://orcid.org/0000-0002-9825-5719
- name: Michiko Yoshitake
  role: author
  orcid: https://orcid.org/0000-0002-0973-5666
- name: Takahiro Nagata
  role: author
  orcid: https://orcid.org/0000-0002-8591-2943
- name: Takeshi Yasuda
  role: author
  orcid: https://orcid.org/0000-0003-4652-9105
- name: Takatsugu Wakahara
  role: author
  orcid: https://orcid.org/0000-0002-6365-3215
- name: Yubin Liu
  role: author
- name: Yoshiyuki Nakajima
  role: author

## Contact agent



## Publisher

organization: Informa UK Limited

## Managing organization



## Keyword

- subject: Material informatics
  schema: not_defined
- subject: automated analysis
  schema: not_defined
- subject: power law
  schema: not_defined
- subject: photoelectron yieldspectroscopy
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: 'Science and Technology of Advanced Materials: Methods'
  issn: '27660400'
  volume: '5'
  issue: '1'

## Conference



## Related item



## Funding

- funder_name: the Research Center for Electronic and Optical Materials in National
    Institute for Materials Science
- identifier: JPMJMI21G2
  funder_name: Materials Exploration space Expansion Platform

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: f6f9f37b-fd7a-460b-9491-b0a40edc15be
  filename: Supplemental_material.pdf
  content_type: application/pdf
  size: 8573984
  md5: 19f2d59d326efb384a40d92166e8e94e
- id: a551dd2a-0673-423d-a0be-0c63494ea7e6
  filename: Automated analysis of photoelectron yield spectroscopy spectra interpreted
    via power laws.pdf
  content_type: application/pdf
  size: 7482855
  md5: 91647e3d38483ff3d94492d946334c4e

## Thumbnail

fileset_id: f6f9f37b-fd7a-460b-9491-b0a40edc15be
filename: Supplemental_material.pdf