# Development of high radiation tolerance detector with CIGS

https://mdr.nims.go.jp/datasets/49751aeb-754b-4245-9b7e-be1a74f47c57

## File

- [JINST___Journal_of_Instrumentation_template.docx](https://mdr.nims.go.jp/filesets/fdae8b2c-6693-47d6-9938-853d59bbcd71/download) ([Detail](https://mdr.nims.go.jp/filesets/fdae8b2c-6693-47d6-9938-853d59bbcd71.md))

## Id

49751aeb-754b-4245-9b7e-be1a74f47c57

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-08-15T00:17:28.953456Z

## Updated at

2025-12-26T01:12:43.749248Z

## Published at

2026-06-16T23:52:03.746568Z

## Doi

https://doi.org/10.48505/nims.6080

## First published url

https://doi.org/10.1088/1748-0221/20/06/c06023

## Date published

2025-06-01

## Recorded date published

2025-6-1

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Development of high radiation tolerance detector with CIGS
  title_type: original
  lang: en

## Description

- description: 'We have been developing a CIGS detector for particle detection with
    high radiation tolerance. We irradiated the CIGS detector with a 132Xe^{54+} ion
    beam, delivering a total ionizing dose (TID) of 0.6MGy at the HIMAC, and confirmed
    the recovery of leakage current and collected charge from radiation damage with
    heat annealing. To investigate higher radiation tolerance of the CIGS semiconductor,
    we irradiated CIGS solar cells with a 70 MeV proton beam with a non-ionizing energy
    loss (NIEL) for 10^{16} neq ·MeV/cm^{2} at the RARiS. The VIn and InCu defects
    created by 70 MeV proton irradiation were observed by deep level transient spectroscopy
    (DLTS). During thermal annealing at around 100◦C, the Cu^+ and V^{−}_{Cu} ions
    are excited to react with defects. These ions interact with V_{In} and In_{Cu}
    defects, creating electrical neutrality: 2Cu^{+} + V^{2}_{In} → Cu_{2}V_{In} and
    2V^{−}_{In} + In^{2+}_{Cu} → 2V_{In}In_{Cu}. By these reaction process, it is
    confirmed that both V_{In} and In_{Cu} defects were reduced by the thermal annealing
    at 130◦C for two hours.'
  description_type: abstract
  lang: und

## Creator

- name: K. Itabashi
  role: author
  orcid: https://orcid.org/0000-0002-6766-4704
- name: M. Togawa
  role: author
  orcid: https://orcid.org/0000-0002-1128-4200
- name: J. Nishinaga
  role: author
  orcid: https://orcid.org/0000-0001-6059-1269
- name: M. Miyahara
  role: author
  orcid: https://orcid.org/0000-0002-5748-5921
- name: H. Okumura
  role: author
  orcid: https://orcid.org/0000-0002-5464-9169
- name: M. Imura
  role: author
  orcid: https://orcid.org/0000-0002-4236-9549
- name: T. Isobe
  role: author
  orcid: https://orcid.org/0000-0001-5163-030X

## Contact agent



## Publisher

organization: IOP Publishing

## Managing organization



## Keyword

- subject: Cu(In, Ga)Se2
  schema: not_defined
- subject: High radiation tolerance detector
  schema: not_defined
- subject: HIMAC
  schema: not_defined
- subject: DLTS
  schema: not_defined

## Rights

- description: This is the Accepted Manuscript version of an article accepted for
    publication in Journal of Instrumentation.  IOP Publishing Ltd is not responsible
    for any errors or omissions in this version of the manuscript or any version derived
    from it.  The Version of Record is available online at https://doi.org/10.1088/1748-0221/20/06/C06023.
  identifier: https://creativecommons.org/licenses/by-nc-nd/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo

start_date: 2025-06-17
end_date: 2026-06-17

## Journal

- title: Journal of Instrumentation
  issn: '17480221'
  volume: '20'
  issue: '06'

## Conference



## Related item



## Funding

- identifier: 21K18635
  funder_name: JSPS KAKENHI
- identifier: 23H01191
  funder_name: JSPS KAKENHI
- identifier: 23K25887
  funder_name: JSPS KAKENHI
- identifier: 21H455
  funder_name: Research ProjectwithHeavyIonsatNIRS-HIMAC

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## Fileset

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  filename: JINST___Journal_of_Instrumentation_template.docx
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  size: 2158049
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## Thumbnail

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filename: JINST___Journal_of_Instrumentation_template.docx