# Calculations of Electron Inelastic Mean Free Paths for 31 Materials

https://mdr.nims.go.jp/datasets/4968db58-dcb9-4833-a21c-dce874bd25c5

## File

- [IMFP I_AuthorManuscript.pdf](https://mdr.nims.go.jp/filesets/e94bf39e-9361-4493-a144-a7ce48c2ccea/download) ([Detail](https://mdr.nims.go.jp/filesets/e94bf39e-9361-4493-a144-a7ce48c2ccea.md))
- [IMFP_I_AuthorManuscript_rev.pdf](https://mdr.nims.go.jp/filesets/e320bfd9-7fe6-4661-94ad-df53bd1a2db1/download) ([Detail](https://mdr.nims.go.jp/filesets/e320bfd9-7fe6-4661-94ad-df53bd1a2db1.md))

## Id

4968db58-dcb9-4833-a21c-dce874bd25c5

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2023-06-01T07:09:39.241451Z

## Updated at

2023-06-09T06:50:37.182788Z

## Published at

2023-06-05T02:13:04.010659Z

## Doi

https://doi.org/10.48505/nims.4168

## First published url

https://doi.org/10.1002/sia.740111107

## Date published

2004-09-15

## Recorded date published

1988-8

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Calculations of Electron Inelastic Mean Free Paths for 31 Materials
  title_type: original
  lang: en

## Description

- description: We present new calculations of electron inelastic mean free paths (IMFPs)
    for 200-2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu,
    Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four
    compounds (LiF, SiO2, ZnS and Al2O3). These calculations are based on an algorithm
    due to Penn which makes use of experimental optical data (to represent the dependence
    of the inelastic scattering probability on energy loss) and the theoretical Lindhard
    dielectric function (to represent the dependence of the scattering probability
    on momentum transfer). Our calculated IMFPs were fitted to the Bethe equation
    for inelastic electron scattering in matter; the two parameters in the Bethe equation
    were then empirically related to several material constants. The resulting general
    IMFP formula is believed to be useful for predicting the IMFP dependence on electron
    energy for a given material and the material dependence for a given energy. The
    new formula also appears to be a reasonable but more approximate guide to electron
    attenuation lengths.
  description_type: abstract
  lang: en

## Creator

- name: Tanuma, S.
  role: author
  orcid: https://orcid.org/0000-0003-2628-9941
  organization: National Bureau of Standards
- name: Powell, C. J.
  role: author
  organization: National Bureau of Standards
- name: Penn, D. R.
  role: author
  organization: National Bureau of Standards

## Contact agent

- name: 田沼繁夫
  email: tanuma.shigeo@nims.go.jp
  orcid: https://orcid.org/0000-0003-2628-9941
  organization: National Institute for Materials Science
  department: 技術開発・共用部門
  ror: https://ror.org/

## Publisher

organization: Wiley

## Managing organization



## Keyword

- subject: IMFP
  schema: not_defined
- subject: inelastic mean free path
  schema: not_defined
- subject: Bethe equation
  schema: not_defined
- subject: TPP
  schema: not_defined
- subject: elemental solids
  schema: not_defined

## Rights

- description: 'This is the peer reviewed version of the following article: Calculations
    of electron inelastic mean free paths for 31 materials, which has been published
    in final form at https://doi.org/10.1002/sia.740111107. This article may be used
    for non-commercial purposes in accordance with Wiley Terms and Conditions for
    Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise
    transformed into a derivative work, without express permission from Wiley or by
    statutory rights under applicable legislation. Copyright notices must not be removed,
    obscured or modified. The article must be linked to Wiley’s version of record
    on Wiley Online Library and any embedding, framing or otherwise making available
    the article or pages thereof by third parties from platforms, services and websites
    other than Wiley Online Library must be prohibited.'
  identifier: https://creativecommons.org/licenses/by-nc/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Surface and Interface Analysis
  issn: '10969918'
  volume: '11'
  issue: '11'
  start_page: 577
  end_page: 589

## Conference



## Related item



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## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Custom property

- name: Information
  value: Added corrected file as "_rev" due to an error in the formula.

## Fileset

- id: e94bf39e-9361-4493-a144-a7ce48c2ccea
  filename: IMFP I_AuthorManuscript.pdf
  content_type: application/pdf
  size: 2871062
  md5: 38db93599e7189b813ef1e7b6ea9b6af
- id: e320bfd9-7fe6-4661-94ad-df53bd1a2db1
  filename: IMFP_I_AuthorManuscript_rev.pdf
  content_type: application/pdf
  size: 2872751
  md5: f33505d5ee61b6d05826f077d21d444f

## Thumbnail

fileset_id: e94bf39e-9361-4493-a144-a7ce48c2ccea
filename: IMFP I_AuthorManuscript.pdf