C. R. da Cunha
;
M. Mineharu
;
M. Matsunaga
;
N. Matsumoto
;
C. Chuang
;
Y. Ochiai
;
G.-H. Kim
;
K. Watanabe
(National Institute for Materials Science
)
;
T. Taniguchi
(National Institute for Materials Science
)
;
D. K. Ferry
;
N. Aoki
説明:
(abstract)We have fabricated a high mobility device composed of a monolayer graphene flake sandwiched between two sheets of boron nitride. Conductance oscillations as functions of a back gate voltage and magnetic field were obtained to check for ergodicity. Non-linear dynamics analysis were used to study the behavior of n-type and p-type carriers. We have found that the carrier motion is chaotic and dissipative at low temperatures, which might be the reason for the observed non-ergodicity. The distribution of eigenvalues was estimated from the conductance oscillations with Gaussian kernels that reveal a Gaussian Unitary Ensemble for p-type carriers, possibly indicating a violation in time-reversal symmetry.
権利情報:
キーワード: High mobility device, graphene, ergodicity
刊行年月日: 2016-09-09
出版者: Springer Nature
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1038/srep33118
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-05-21 08:30:13 +0900
MDRでの公開時刻: 2025-05-21 08:28:19 +0900
| ファイル名 | サイズ | |||
|---|---|---|---|---|
| ファイル名 |
srep33118.pdf
(サムネイル)
application/pdf |
サイズ | 960KB | 詳細 |