# In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb<sub>3</sub>Sn layers

https://mdr.nims.go.jp/datasets/4821e982-adad-40ef-92ff-58394e4e190c

## File

- [Proof_SUST_v37_n3_2024_035019_(Banno_STEM-HfTa-HfTi-Nb3Sn).pdf](https://mdr.nims.go.jp/filesets/501333de-8f05-40ab-958b-30fda2072f9b/download) ([Detail](https://mdr.nims.go.jp/filesets/501333de-8f05-40ab-958b-30fda2072f9b.md))

## Id

4821e982-adad-40ef-92ff-58394e4e190c

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-04-08T04:19:22.000935Z

## Updated at

2025-02-14T03:31:24.673361Z

## Published at

2025-02-14T03:31:24.792793Z

## Doi

https://doi.org/10.48505/nims.4475

## First published url

https://doi.org/10.1088/1361-6668/ad2982

## Date published

2024-03-01

## Recorded date published

2024-3-1

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb<sub>3</sub>Sn layers
  title_type: original
  lang: en

## Description

- description: In this article, the grain morphologies of Ti–Hf and Ta–Hf-doped Nb3Sn
    layers were clarified by scanning transmission electron microscopy (STEM) and
    TEM-based automated crystal orientation mapping (ACOM-TEM). STEM/energy dispersive
    X-ray spectroscopy (EDS) revealed no significant oxide precipitates in our samples.
    The grain size distribution was attained by ACOM-TEM. One remarkable new finding
    through STEM/EDS was the presence of a Cu–Hf compound phase in the Nb3Sn layer.
    The large Cu deposition on the grain boundaries might facilitate grain growth
    in Nb3Sn.
  description_type: abstract
  lang: und

## Creator

- name: Nobuya Banno
  role: author
  orcid: https://orcid.org/0000-0002-7141-541X
  organization: National Institute for Materials Science
- name: Taku Moronaga
  role: author
  orcid: https://orcid.org/0000-0002-6915-0627
  organization: National Institute for Materials Science
- name: Toru Hara
  role: author
  orcid: https://orcid.org/0000-0002-9715-6444
  organization: National Institute for Materials Science
- name: Koki Asai
  role: author
- name: Tsuyoshi Yagai
  role: author
  orcid: https://orcid.org/0000-0003-1842-7881

## Contact agent



## Publisher

organization: IOP Publishing

## Managing organization



## Keyword

- subject: Nb3Sn
  schema: not_defined
- subject: Hf doping
  schema: not_defined
- subject: ACOM-TEM
  schema: not_defined
- subject: TEM
  schema: not_defined
- subject: grain growth
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by-nc-nd/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo

start_date: 2024-02-14
end_date: 2025-02-14

## Journal

- title: Superconductor Science and Technology
  issn: '09532048'
  volume: '37'
  issue: '3'
  start_page: 35019

## Conference



## Related item



## Funding

- identifier: JP23K04453
  funder_name: JSPS KAKENHI

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 501333de-8f05-40ab-958b-30fda2072f9b
  filename: Proof_SUST_v37_n3_2024_035019_(Banno_STEM-HfTa-HfTi-Nb3Sn).pdf
  content_type: application/pdf
  size: 2347138
  md5: 5e6c58508f778c442d57dca01c658d6e

## Thumbnail

fileset_id: 501333de-8f05-40ab-958b-30fda2072f9b
filename: Proof_SUST_v37_n3_2024_035019_(Banno_STEM-HfTa-HfTi-Nb3Sn).pdf