Keyun Gu
;
Kongping Wu
;
Zilong Zhang
;
Takeo Ohsawa
;
Jian Huang
;
Yasuo Koide
;
Masaya Toda
;
Meiyong Liao
説明:
(abstract)To achieve ultra-high gain deep-ultraviolet (DUV) detectors based on ultra-wide bandgap semiconductors comparable with those of bulky photomultiplier tubes (PMTs), avalanche photodiodes have usually been adopted. However, the high-operation voltage (∼100 V) is not compatible with monolithic integration. Herein, it is demonstrated that the ultra-high gain DUV photodetectors (PDs) with low operation voltages (<5 V) can be achieved by using the synergistic effect of surface states and deep defects in a type-Ib single-crystal diamond (SCD) substrate. The overall photoresponse, such as the sensitivity, dark current, spectral selectivity, and response speed, of the diamond DUV-PDs can be simply tailored by the surface hydrogen or oxygen termination of the SCD substrate. The DUV responsivity and external quantum efficiency are more than 2.5 × 104A/W and 1.4 × 107%, respectively, at 220 nm-wavelength light, comparable with those of PMTs. The DUV/visible light rejection ratio (R220 nm/R400 nm) is as high as 6.7 × 105. The depletion of the 2D hole gas by deep nitrogen defect provides a low dark current and the filling of the ionized nitrogen upon DUV illumination induces a huge photocurrent. The synergistic effect of the surface states and the bulk deep defects opens the avenue for the development of DUV detectors compatible with integrated circuits.
権利情報:
キーワード: Diamond, photodetector
刊行年月日: 2024-12-04
出版者: Wiley
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5443
公開URL: https://doi.org/10.1002/adfm.202420238
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その他の識別子:
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更新時刻: 2025-12-04 08:30:33 +0900
MDRでの公開時刻: 2025-12-04 08:22:26 +0900
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2024.0928 revised manuscript LiaoR1.pdf
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サイズ | 1.79MB | 詳細 |