説明:
(abstract)We show that the transconductance of multilayer WSe2 field-effect transistors serves as a direct electrical spectrometer of the intervalley relaxation time τiv, previously accessible only by ultrafast optical techniques. Extending an equilibrium valley-thermodynamics framework with a single relaxation equation for the Γ-valley carrier fraction fΓ(t), we predict three signatures: (i) a Lorentzian transconductance gm(ω) = gm,0 + g0m,v/(1 + iωτiv), whose imaginary part peaks at ωc = τiv−1 with opposite signs for bilayer and trilayer; (ii) a two-stage current transient after a gate step, exhibiting bilayer overshoot or trilayer undershoot; and (iii) sweep-rate-proportional hysteresis whose gate-voltage profile and layer-number sign reversal distinguish valley from trap-induced dynamics. All three signatures provide quantitative electrical access to τiv with standard rf and dc instrumentation.
権利情報:
©2026 American Physical Society
キーワード: Intervalley relaxation, Valley dynamics, Valleytronics, Multilayer WSe2, Two-dimensional semiconductors, Transconductance spectroscopy, Field-effect transistors
刊行年月日: 2026-08-28
出版者: American Physical Society (APS)
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研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.6491
公開URL: https://doi.org/10.1103/p8mx-dr9j
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更新時刻: 2026-08-31 10:59:17 +0900
MDRでの公開時刻: 2026-08-31 12:26:11 +0900