# Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for Surface Electron Spectroscopies

https://mdr.nims.go.jp/datasets/31231150-456b-4eb8-80d9-358b3c580150

## File

- [15 LEE2015_Tanuma_4.pdf](https://mdr.nims.go.jp/filesets/2dff5039-d9fb-4aba-ada0-0e40ea85c962/download) ([Detail](https://mdr.nims.go.jp/filesets/2dff5039-d9fb-4aba-ada0-0e40ea85c962.md))

## Id

31231150-456b-4eb8-80d9-358b3c580150

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2023-06-28T06:34:41.158331Z

## Updated at

2023-06-29T02:57:06.635784Z

## Published at

2023-06-29T04:30:46.007447Z

## Doi

https://doi.org/10.48505/nims.4207

## First published url



## Date published



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## Resource type

conference_presentation

## Manuscript type

na

## Collection



## Title

- title: Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation
    Lengths for Surface Electron Spectroscopies
  title_type: original
  lang: ja
- title: Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation
    Lengths for Surface Electron Spectroscopies
  title_type: alternative
  lang: en

## Description

- description: While the IMFP is a basic material parameter, the EAL, MED, and ID
    depend not only on the IMFP but also on the instrumental configuration and the
    magnitudes of elastic-scattering effects on the trajectories of the detected electrons.
    Since these parameters are often confused or misunderstood, we first give definitions
    of each term based on the ISO18115-2010. We then present examples of recent calculations
    of IMFPs for electron energies up to 30 keV. Information is given there on IMFPs
    for selected elemental solids and inorganic compounds, comparisons of calculated
    and measured IMFPs, and the analytical equation TPP-2M for estimating IMFPs. We
    also refer to the absolute elastic-peak electron spectroscopy (EPES) over 10 eV
    - 5 keV for elemental solids and compounds.
  description_type: abstract
  lang: jpn

## Creator

- name: 田沼 繁夫
  role: author
  orcid: https://orcid.org/0000-0003-2628-9941
  organization: 物質・材料研究機構
  department: 表面化学分析グループ
  ror: https://ror.org/026v1ze26
- name: 後藤啓典
  role: author
  organization: 産総研
- name: 吉川 英樹
  role: author
  orcid: https://orcid.org/0000-0002-7389-8865
  organization: 物質・材料研究機構
  department: 表面化学分析グループ
  ror: https://ror.org/026v1ze26
- name: パウエル
  role: author
  organization: NIST
- name: Penn, D. R.
  role: author
  organization: NIST
- name: Da, B.
  role: author
  organization: 物質・材料研究機構
- name: Ueda, R.
  role: author
  organization: 物質・材料研究機構
- name: Shinotsuka, H
  role: author
  organization: 物質・材料研究機構

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## Keyword

- subject: EPES
  schema: not_defined
- subject: IMFP
  schema: not_defined
- subject: EAL
  schema: not_defined
- subject: elemental solids
  schema: not_defined
- subject: inorganic compounds
  schema: not_defined
- subject: water
  schema: not_defined

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- data_origin_type: other

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## Fileset

- id: 2dff5039-d9fb-4aba-ada0-0e40ea85c962
  filename: 15 LEE2015_Tanuma_4.pdf
  content_type: application/pdf
  size: 31504755
  md5: 91ac9dc48439de019419884711879c53

## Thumbnail

fileset_id: 2dff5039-d9fb-4aba-ada0-0e40ea85c962
filename: 15 LEE2015_Tanuma_4.pdf