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Depth-dependent electronic states of a prototypical strongly correlated Fe₃O₄ thin film across the Verwey transition temperature (T_V∼125K) were investigated by hard x-ray photoemission spectroscopy (HAXPES) combined with x-ray total reflection (TR). We found that the Fe 2p HAXPES spectral shapes strongly depend on the effective inelastic mean-free-path (λ_eff) regardless of temperature (T). Particularly, the shoulder structure located at the lower binding energy side of the Fe 2p_3/2 main peak becomes more pronounced with increasing λ_eff (i.e., increasing bulk sensitivity), indicating a significant difference in the electronic structures between the surface and deeper regions of the film. This trend coincides with the increase of the density of states near the Fermi level (E_F) for larger λ_eff, suggesting the contribution of nonlocal screening effects. While the valence band spectra show a clear metal-to-insulator transition across T_V, the Fe 2p core-level HAXPES and the magnetic circular dichroism profiles for large λ_eff are almost independent on T. This behavior suggests that the average valence of the B-site Fe species is maintained at 2.5+ across T_V.

権利情報:

• In Copyright
  

  ©2026 American Physical Society

キーワード: HAXPES, Fe3O4 thin film, depth dependence, electronic states, surface region, deeper region

刊行年月日: 2026-11-02

出版者: American Physical Society (APS)

掲載誌:

• Physical Review B (ISSN: 24699950) vol. 114 issue. 28 285103

研究助成金:

• Tokodai Institute for Element Strategy JPMXP0112101001
• Ministry of Education, Culture, Sports, Science and Technology JPMXP1122683430

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.8699

公開URL: https://doi.org/10.1103/lyp6-ctpz

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更新時刻: 2026-11-04 14:59:07 +0900

MDRでの公開時刻: 2026-11-04 16:34:48 +0900