Strain Analysis of Thermoelectric Materials Using High-resolution Synchrotron X-ray Diffraction Data

Hayato Nakasawa; Takahisa Shobu; Aki Tominaga; Masashi Fujii; Hironari Mstsumoto; Michiko Matsuda; Takeshi Shimada; Vikrant Trivedi; Makoto Tachibana; Naohito Tsujii; Takao Mori

doi:10.2497/jjspm.15p-t21-07

論文 Strain Analysis of Thermoelectric Materials Using High-resolution Synchrotron X-ray Diffraction Data

Hayato Nakasawa ; Takahisa Shobu ; Aki Tominaga ; Masashi Fujii ; Hironari Mstsumoto ; Michiko Matsuda ; Takeshi Shimada ; Vikrant Trivedi (National Institute for Materials Science) ; Makoto Tachibana (National Institute for Materials Science) ; Naohito Tsujii (National Institute for Materials Science) ; Takao Mori (National Institute for Materials Science)

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Hayato Nakasawa, Takahisa Shobu, Aki Tominaga, Masashi Fujii, Hironari Mstsumoto, Michiko Matsuda, Takeshi Shimada, Vikrant Trivedi, Makoto Tachibana, Naohito Tsujii, Takao Mori. Strain Analysis of Thermoelectric Materials Using High-resolution Synchrotron X-ray Diffraction Data. Journal of the Japan Society of Powder and Powder Metallurgy. 2025, 72 (), 15P-T21-07. https://doi.org/10.2497/jjspm.15p-t21-07

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(abstract)

A compressive strength limit is one of critical parameters for thermoelectric materials. In this study, we synthesized a single crystal of Yb-filled Co–Sb-based skutterudite. We assessed the compressive pressure dependence of internal strain using high-resolution synchrotron radiation X-rays at SPring-8. The prepared single crystal was identified as Yb0.148Co4Sb12.54, with a lattice parameter of 9.0504 Å. Compressive testing was performed until the sample fractured, revealing a compressive strength limit of 591.3 MPa. The stress–strain curve exhibited a nearly constant slope for strains exceeding 0.07%, leading to an estimated Young’s modulus of 154.6 GPa.

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