@misc{martin2024a,
  title = {Defect engineering-induced Seebeck coefficient and carrier concentration decoupling in CuI by noble gas ion implantation},
  author = {Martin Markwitz, Peter P. Murmu, Takao Mori, John V. Kennedy, Ben J. Ruck},
  publisher = {AIP Publishing},
  year = {2024-11-18},
  keywords = {thermoelectric}
}