# Exploring partially reduced CeO 2(111) surface at the atomic scale using scanning probe microscopy

https://mdr.nims.go.jp/datasets/266e3feb-810b-438e-88f1-f2af741f5f88

## File

- [supplementary_data.pdf](https://mdr.nims.go.jp/filesets/ba593a5a-e7a3-4567-b2e0-1ff5dff3d892/download) ([Detail](https://mdr.nims.go.jp/filesets/ba593a5a-e7a3-4567-b2e0-1ff5dff3d892.md))
- [Exploring partially reduced CeO 2 111  surface at the atomic scale using scanning probe microscopy.pdf](https://mdr.nims.go.jp/filesets/4f299bc9-884e-4949-9e1f-9bba6edc39d1/download) ([Detail](https://mdr.nims.go.jp/filesets/4f299bc9-884e-4949-9e1f-9bba6edc39d1.md))

## Id

266e3feb-810b-438e-88f1-f2af741f5f88

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-08-18T01:25:42.600432Z

## Updated at

2025-08-19T03:30:24.237295Z

## Published at

2025-08-19T03:21:33.249361Z

## Doi



## First published url

https://doi.org/10.1080/14686996.2025.2528596

## Date published

2025-12-31

## Recorded date published

2025-12-31

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Exploring partially reduced CeO 2(111) surface at the atomic scale using
    scanning probe microscopy
  title_type: original
  lang: en

## Description

- description: Cerium dioxide (CeO2) is extensively studied due to its exceptional
    redox properties, which are closely related to oxygen vacancy formation and the
    associated charging of cerium atoms from Ce4+ to Ce3+. These charged species play
    an important role in promoting active sites in CeO2-based catalysts. The existence
    of Ce3+ atoms is typically characterized by means of surface spectroscopic techniques,
    because the direct atomic-scale observation and discrimination of Ce3+ ions from
    Ce4+ atoms remains challenging. Here, we use simultaneous scanning tunneling microscopy
    (STM) and atomic force microscopy (AFM) complemented by force spectroscopy to
    characterize candidates to Ce3+ atoms on partially reduced CeO2(111) samples.
    While STM images reveal electronic modulations of the atomic contrast in the form
    of an inhomogeneous shading, AFM clearly differentiates these electronic features
    from the true topographic atomic structure. The chemical reactivity of these candidates
    to Ce3+ atoms is quantified against the Ce4+ counterparts by means of force spectroscopy
    using carbon monoxide functionalized probes. This study demonstrates that the
    combination of STM with AFM and force spectroscopy bears great potential to provide
    robust atomic-level insights into the chemistry of defects at ceria surfaces.
  description_type: abstract
  lang: und

## Creator

- name: Kyungmin Kim
  role: author
  orcid: https://orcid.org/0000-0002-3147-5100
- name: Masayuki Abe
  role: author
  orcid: https://orcid.org/0000-0001-5619-3911
- name: Shigeki Kawai
  role: author
  orcid: https://orcid.org/0000-0003-2128-0120
- name: Oscar Custance
  role: author
  orcid: https://orcid.org/0000-0001-7931-603X

## Contact agent



## Publisher

organization: Informa UK Limited

## Managing organization



## Keyword

- subject: Metal oxide surface
  schema: not_defined
- subject: ceria
  schema: not_defined
- subject: scanning tunneling microscopy
  schema: not_defined
- subject: atomic force microscopy;
  schema: not_defined
- subject: force spectroscopy
  schema: not_defined
- subject: Ce3+
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by-nc/4.0/

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## Journal

- title: Science and Technology of Advanced Materials
  issn: '14686996'
  volume: '26'
  issue: '1'
  article_number: '2528596'

## Conference



## Related item



## Funding

- identifier: AG2030
  funder_name: The National Institute for Materials Science
- identifier: 19H05789
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 21H01812
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 21K18876
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 22H00285
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 24K01350
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 24K21716
  funder_name: The Ministry of Education, Culture, Sports, Science and Technology
    of Japan
- identifier: 23KJ1516
  funder_name: JSPS DC1 fellowship
- identifier: AM2100
  funder_name: The National Institute for Materials Science

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## Fileset

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  filename: supplementary_data.pdf
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  size: 1629645
  md5: 2d0ac7ab507de92c2bc1551feaff5f06
- id: 4f299bc9-884e-4949-9e1f-9bba6edc39d1
  filename: Exploring partially reduced CeO 2 111  surface at the atomic scale using
    scanning probe microscopy.pdf
  content_type: application/pdf
  size: 7435900
  md5: 60a766e33a2a82411ae1af3d38a4acc4

## Thumbnail

fileset_id: ba593a5a-e7a3-4567-b2e0-1ff5dff3d892
filename: supplementary_data.pdf