# XAFS spectrum of Silicon nitride

https://mdr.nims.go.jp/datasets/1c86b61f-ce7a-4803-9ade-f249f48cb544

## File

- [17030603.dat](https://mdr.nims.go.jp/filesets/8e56efbe-9488-4ee6-a96c-4054999fc86d/download) ([Detail](https://mdr.nims.go.jp/filesets/8e56efbe-9488-4ee6-a96c-4054999fc86d.md))
- [17030603.pfy](https://mdr.nims.go.jp/filesets/26bb7fa9-6565-46d0-bc8a-71aa983f7831/download) ([Detail](https://mdr.nims.go.jp/filesets/26bb7fa9-6565-46d0-bc8a-71aa983f7831.md))
- [17030603.tey](https://mdr.nims.go.jp/filesets/f068926c-11b4-45f3-af5e-476dba223735/download) ([Detail](https://mdr.nims.go.jp/filesets/f068926c-11b4-45f3-af5e-476dba223735.md))
- [metadata.json](https://mdr.nims.go.jp/filesets/a7a378c7-bb54-4c51-a4b2-2defe4b4a355/download) ([Detail](https://mdr.nims.go.jp/filesets/a7a378c7-bb54-4c51-a4b2-2defe4b4a355.md))
- [metadata.yml](https://mdr.nims.go.jp/filesets/66645ae8-5122-4fa8-8451-75dbc393936f/download) ([Detail](https://mdr.nims.go.jp/filesets/66645ae8-5122-4fa8-8451-75dbc393936f.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/40804f19-7bb8-4a3d-aba6-54c26642af43/download) ([Detail](https://mdr.nims.go.jp/filesets/40804f19-7bb8-4a3d-aba6-54c26642af43.md))
- [BL10_Si-K_007_pfy.png](https://mdr.nims.go.jp/filesets/73c1c469-bca5-44db-9ad9-a2edf92c3eec/download) ([Detail](https://mdr.nims.go.jp/filesets/73c1c469-bca5-44db-9ad9-a2edf92c3eec.md))
- [BL10_Si-K_007_tey.png](https://mdr.nims.go.jp/filesets/3780fc1a-22c3-47ad-b704-9edf0f411e98/download) ([Detail](https://mdr.nims.go.jp/filesets/3780fc1a-22c3-47ad-b704-9edf0f411e98.md))

## Id

1c86b61f-ce7a-4803-9ade-f249f48cb544

## Local identifier

identifier: Ritsu_MDR_20220603/mdr-bp0004-0000048

## Visibility

open_to_public

## State

published

## Created at

2022-03-28T11:22:26.552694Z

## Updated at

2025-05-02T12:38:36.618833Z

## Published at

2022-06-10T13:38:17.547522Z

## Doi

https://doi.org/10.48505/nims.3330

## First published url

https://www.ritsumei.ac.jp/acd/re/src/sx_xafs_db/

## Date published



## Recorded date published



## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Silicon nitride
  title_type: original
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Si K-edge of Silicon nitride measured at Ritsumeikan-SR BL-10, and is a part
    of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Ritsumeikan SR Center
  role: author
  organization: Ritsumeikan University
  ror: https://ror.org/0197nmd03

## Contact agent

- name: Ritsumeikan SR Center
  organization: Ritsumeikan University

## Publisher

organization: Ritsumeikan University

## Managing organization



## Keyword

- subject: Silicon nitride
  schema: not_defined
- subject: Si3N4
  schema: not_defined
- subject: Si K-edge
  schema: not_defined
- subject: Nitride
  schema: not_defined
- subject: BL-10
  schema: not_defined
- subject: Ritsumeikan-SR
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: collection - MDR XAFS DB
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin

- data_origin_type: experiment

## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL-10_XAFS
  description: Ritsumeikan SR Center Soft X-ray XAFS Beamline setup
  manufacturer: Ritsumeikan SR Center
  function_description: x-ray absorption spectroscopy

## Instrument operator



## Instrument managing organization

- organization: Ritsumeikan University
  department: Ritsumeikan SR Center
  ror: '0197nmd03'

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: TEY
  measured_at: '2017-03-06T04:17:12Z'
- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: PFY
  measured_at: '2017-03-06T04:17:12Z'

## Specimen

- name: Silicon nitride
  description: powder, on carbon tape
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q732
  material_type_description: Nitride

## Chemical composition

- identifier: 12033-89-5
  category_vocabulary: http://matvoc.nims.go.jp/entity/Q2369

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2501
  description: Si K-edge

## Software



## Custom property



## Fileset

- id: 8e56efbe-9488-4ee6-a96c-4054999fc86d
  filename: 17030603.dat
  content_type: application/octet-stream
  size: 31065
  md5: 93d762cb0cf7063ffc6691566fd11189
- id: 26bb7fa9-6565-46d0-bc8a-71aa983f7831
  filename: 17030603.pfy
  content_type: application/octet-stream
  size: 5409
  md5: 87eec04299b099706c13ca22df055cc2
- id: f068926c-11b4-45f3-af5e-476dba223735
  filename: 17030603.tey
  content_type: application/octet-stream
  size: 5429
  md5: cd26f44b921cd8f74961994d74a8f8d9
- id: a7a378c7-bb54-4c51-a4b2-2defe4b4a355
  filename: metadata.json
  content_type: application/json
  size: 15549
  md5: eb10292d02edd9e1cbd5d3eb7b0520ba
- id: 66645ae8-5122-4fa8-8451-75dbc393936f
  filename: metadata.yml
  content_type: application/octet-stream
  size: 8119
  md5: c24e731366eb653ab80f757529457e76
- id: 40804f19-7bb8-4a3d-aba6-54c26642af43
  filename: primary.tsv
  content_type: text/tab-separated-values
  size: 14588
  md5: 74f4d9e751a21a4d734c951f7c225daa
- id: 73c1c469-bca5-44db-9ad9-a2edf92c3eec
  filename: BL10_Si-K_007_pfy.png
  content_type: image/png
  size: 19788
  md5: bbaa53ef7da7771883b6114b689d1811
- id: 3780fc1a-22c3-47ad-b704-9edf0f411e98
  filename: BL10_Si-K_007_tey.png
  content_type: image/png
  size: 20594
  md5: 40c581a492757a9b541eb4f16ed18962

## Thumbnail

fileset_id: 3780fc1a-22c3-47ad-b704-9edf0f411e98
filename: BL10_Si-K_007_tey.png