# XAFS spectrum of Vanadium nitride

https://mdr.nims.go.jp/datasets/1b22dd05-a0e2-4b83-a1f5-e45182b427a0

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/6aa335c9-3784-4faf-8c59-dd3470dca18c/download) ([Detail](https://mdr.nims.go.jp/filesets/6aa335c9-3784-4faf-8c59-dd3470dca18c.md))
- [V-K_VN_Si111_100ms_180211.txt](https://mdr.nims.go.jp/filesets/54b9ff2b-4820-48b7-a951-7b55237e9c08/download) ([Detail](https://mdr.nims.go.jp/filesets/54b9ff2b-4820-48b7-a951-7b55237e9c08.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/18185626-8534-40dd-9684-6fccc4f0229c/download) ([Detail](https://mdr.nims.go.jp/filesets/18185626-8534-40dd-9684-6fccc4f0229c.md))
- [VN.thumb.png](https://mdr.nims.go.jp/filesets/657c546e-776f-4069-994d-ad81c63b96db/download) ([Detail](https://mdr.nims.go.jp/filesets/657c546e-776f-4069-994d-ad81c63b96db.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/a589f2d3-b9a0-4a8c-b9b1-5020f88f24b4/download) ([Detail](https://mdr.nims.go.jp/filesets/a589f2d3-b9a0-4a8c-b9b1-5020f88f24b4.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/04930a6c-3de5-43b5-b3be-a20598216640/download) ([Detail](https://mdr.nims.go.jp/filesets/04930a6c-3de5-43b5-b3be-a20598216640.md))
- [V-K_VN_Si111_100ms_180211.ex3](https://mdr.nims.go.jp/filesets/8ce1207e-305c-4f17-99d3-6824a8d08a9b/download) ([Detail](https://mdr.nims.go.jp/filesets/8ce1207e-305c-4f17-99d3-6824a8d08a9b.md))
- [V-K_VN_Si111_100ms_180211.dat](https://mdr.nims.go.jp/filesets/0648c969-da39-4a41-92f5-18fd95cf568d/download) ([Detail](https://mdr.nims.go.jp/filesets/0648c969-da39-4a41-92f5-18fd95cf568d.md))

## Id

1b22dd05-a0e2-4b83-a1f5-e45182b427a0

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:11:57.935240Z

## Updated at

2025-05-02T12:38:15.683084Z

## Published at

2021-08-12T16:08:36.155538Z

## Doi

https://doi.org/10.48505/nims.2413

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-23

## Recorded date published

23/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Vanadium nitride
  title_type: original
  lang: en
- title: spring8.6bef6e4f-567f-419a-8abd-5f6c5387faad
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at V K-edge of Vanadium nitride measured at SPring-8 BL14B2, and is a part of
    XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: VN
  schema: not_defined
- subject: V K-edge
  schema: not_defined
- subject: Nitride
  schema: not_defined
- subject: Vanadium nitride
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2018-02-11T10:49:00Z'

## Specimen

- name: Vanadium nitride
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q732
  material_type_description: Nitride

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1757

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2510
  description: V K-edge

## Software



## Custom property



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## Thumbnail

fileset_id: 657c546e-776f-4069-994d-ad81c63b96db
filename: VN.thumb.png