# Measurements of in-plane thermophysical properties on nanoscale-thick films by lock-in thermography

https://mdr.nims.go.jp/datasets/1a004645-5280-46a8-8ba1-fe97e5e43476

## Files

- [ALASLI_APL_Manuscript.pdf](https://mdr.nims.go.jp/filesets/2b844d23-b5a6-4815-a892-6844d5c36da7/download) ([Detail](https://mdr.nims.go.jp/filesets/2b844d23-b5a6-4815-a892-6844d5c36da7.md))

## Id

1a004645-5280-46a8-8ba1-fe97e5e43476

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2025-02-08T07:57:08.547836Z

## Updated at

2025-02-10T07:30:28.861600Z

## Published at

2025-02-10T07:30:28.966669Z

## Doi

https://doi.org/10.48505/nims.5316

## First published url

https://doi.org/10.1063/5.0245566

## Date published

2025-01-27

## Recorded date published

2025-1-27

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Measurements of in-plane thermophysical properties on nanoscale-thick films
    by lock-in thermography
  title_type: original
  lang: en

## Description

- description: We demonstrate a versatile technique for measuring the in-plane thermal
    conductivity, in-plane thermal diffusivity, and volumetric heat capacity of nanoscale-thick
    films by means of lock-in thermography. The technique relies on the thermal analyses
    of the imaged lock-in temperature distribution over the surface of the films generated
    by an on-chip line heater. This enables simultaneous estimation of the properties
    for a free-standing membrane or multilayered thin films deposited on the membrane.
    We validate the usability of the technique by determining the thermophysical properties
    of Ni films with different nanoscale thicknesses. This technique also enables
    the measurements under an external magnetic field, facilitating investigating
    magneto-thermal transport properties. Thus, the proposed approach will be useful
    for exploring nanoscale thermal transport properties in thin films and thermal
    management systems.
  description_type: abstract
  lang: und

## Creator

- name: Abdulkareem Alasli
  role: author
  orcid: https://orcid.org/0000-0002-1681-0492
- name: Ryo Iguchi
  role: author
  orcid: https://orcid.org/0000-0002-8112-4608
- name: Ken-ichi Uchida
  role: author
  orcid: https://orcid.org/0000-0001-7680-3051
- name: Hosei Nagano
  role: author
  orcid: https://orcid.org/0000-0003-4926-2768

## Contact agent



## Publisher

organization: AIP Publishing

## Managing organization



## Keyword

- subject: Thermal transport
  schema: not_defined
- subject: Thin film
  schema: not_defined
- subject: Lock-in thermography
  schema: not_defined

## Rights

- description: 'This article may be downloaded for personal use only. Any other use
    requires prior permission of the author and AIP Publishing. This article appeared
    in Abdulkareem Alasli, Ryo Iguchi, Ken-ichi Uchida, Hosei Nagano; Measurements
    of in-plane thermophysical properties on nanoscale-thick films by lock-in thermography.
    Appl. Phys. Lett. 27 January 2025; 126 (4): 044102 and may be found at https://doi.org/10.1063/5.0245566.'
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Applied Physics Letters
  issn: '00036951'
  volume: '126'
  issue: '4'

## Conference



## Related item



## Funding

- identifier: JPMJCR17I1
  funder_name: Core Research for Evolutional Science and Technology
- identifier: JPMJER2201
  funder_name: Exploratory Research for Advanced Technology

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## Measurement method



## Specimen



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## Fileset

- id: 2b844d23-b5a6-4815-a892-6844d5c36da7
  filename: ALASLI_APL_Manuscript.pdf
  content_type: application/pdf
  size: 631608
  md5: c2e38fdb5919af311bf8edf9b2f89ed5

## Thumbnail

fileset_id: 2b844d23-b5a6-4815-a892-6844d5c36da7
filename: ALASLI_APL_Manuscript.pdf