# Development of Fourier Transform Ultrafast Laser Flash Method for Simultaneous Measurement of Thermal Diffusivity and Interfacial Thermal Resistance

https://mdr.nims.go.jp/datasets/190d0d38-a0d6-43bf-9b00-eca22c8cbc1b

## File

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## Id

190d0d38-a0d6-43bf-9b00-eca22c8cbc1b

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-03-27T13:59:19.786026Z

## Updated at

2024-07-31T23:30:09.604431Z

## Published at

2024-07-31T23:30:09.990231Z

## Doi



## First published url

https://doi.org/10.1007/s10765-023-03324-w

## Date published

2024-02-01

## Recorded date published

2024-2

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Development of Fourier Transform Ultrafast Laser Flash Method for Simultaneous
    Measurement of Thermal Diffusivity and Interfacial Thermal Resistance
  title_type: original
  lang: en

## Description

- description: 'The thermo-reflectance technique is one of the few methods which can
    measure thermal diffusivity of thin films as thin as 100 nm or thinner in the
    cross-plane direction. Up to now it has typically only been possible to attempt
    to evaluate the interfacial thermal resistance between the thin films by preparing
    and measuring several samples with different thicknesses. In this study, a method
    to directly determine interfacial thermal resistance by a single measurement of
    a thin film on substrate is represented, by analyzing the shape of thermo-reflectance
    signals with analytical solutions in frequency domain and time domain. Thermo-reflectance
    signals observed from metallic thin films on sapphire substrate with different
    thickness steps were analyzed by Fourier analysis and fitted by analytical equations
    with four parameters: heat diffusion time across the first layer, ratio of virtual
    heat sources, characteristic time of cooling determined by interfacial thermal
    resistance and relative amplitude of the signal. Interface thermal resistance
    between the thin film and substrate was able to be determined reliably with smaller
    uncertainty.'
  description_type: abstract
  lang: und

## Creator

- name: Takahiro Baba
  role: author
- name: Tetsuya Baba
  role: author
  orcid: https://orcid.org/0000-0001-5820-3757
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Takao Mori
  role: author
  orcid: https://orcid.org/0000-0003-2682-1846
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: Springer Science and Business Media LLC

## Managing organization



## Keyword

- subject: thermal conductivity
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: International Journal of Thermophysics
  issn: '0195928X'
  article_number: '27'

## Conference



## Related item



## Funding

- identifier: JPMJMI19A1
  funder_name: JST-Mirai Program
- identifier: JPMJSP2124
  funder_name: Japan Science and Technology Agency

## Instrument



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## Fileset

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  filename: s10765-023-03324-w.pdf
  content_type: application/pdf
  size: 2993364
  md5: e3fb5c231428de05fe1bcdc457027dc0

## Thumbnail

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filename: s10765-023-03324-w.pdf