# The CIGS semiconductor detector for particle physics

https://mdr.nims.go.jp/datasets/176fdf38-d94d-4fa3-9ada-ca3dd9c232f2

## Files

- [Togawa Upload jinst-latex-sample.pdf](https://mdr.nims.go.jp/filesets/61474fab-45a9-45fd-85af-7a7dbc16b1b7/download) ([Detail](https://mdr.nims.go.jp/filesets/61474fab-45a9-45fd-85af-7a7dbc16b1b7.md))

## Id

176fdf38-d94d-4fa3-9ada-ca3dd9c232f2

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-05-31T01:40:22.497899Z

## Updated at

2025-05-19T23:30:18.035135Z

## Published at

2025-05-19T23:19:01.131939Z

## Doi

https://doi.org/10.48505/nims.4525

## First published url

https://doi.org/10.1088/1748-0221/19/05/c05042

## Date published

2024-05-01

## Recorded date published

2024-5-1

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: The CIGS semiconductor detector for particle physics
  title_type: original
  lang: en

## Description

- description: Silicon is commonly used as a sensor material in a wide variety of
    imaging application. In recent high-energy and intensity beam experiments, high
    radiation tolerance is required, and new semiconductor detector consisting of
    radiation-hard materials have been investigated. The Cu(In,Ga)Se2 (CIGS) semiconductor
    is expected to possess high radiation tolerance, with the ability to recover from
    radiation damage through the compensation of defects by ions. The CIGS has originally
    developed for a solar cell and its radiation tolerance was investigated for the
    usage in space. The CIGS, featuring a recovery capability, would shed new light
    to particle detector in high radiation environments. CIGS detectors (2 and 5 μm
    thick) were tested by Xe ion (400 MeV/u, 132Xe54+) at HIMAC, successfully detecting
    single Xe ion with a fast response. The output charge is understandable through
    estimation with the GEANT4 simulation. With 0.6 MGy irradiation by Xe ions, the
    CIGS output degraded to 50%, but it was recovered to 97% after the heat treatment
    under 130 ◦C for 2 hours. This marks a significant step in confirming that CIGS
    semiconductors can serve as particle detectors with recovery features for radiation
    damage.
  description_type: abstract
  lang: und

## Creator

- name: M. Togawa
  role: author
  orcid: https://orcid.org/0000-0002-1128-4200
- name: S. Fujii
  role: author
- name: M. Imura
  role: author
  orcid: https://orcid.org/0000-0002-4236-9549
- name: K. Itabashi
  role: author
- name: T. Isobe
  role: author
- name: M. Miyahara
  role: author
- name: J. Nishinaga
  role: author
- name: H. Okumura
  role: author

## Contact agent



## Publisher

organization: IOP Publishing

## Managing organization



## Keyword

- subject: CIGS
  schema: not_defined
- subject: Semiconductor detector
  schema: not_defined
- subject: Particle physics
  schema: not_defined

## Rights

- description: "© 2024 IOP Publishing Ltd and Sissa Medialab<br>\r\nThis is an author-created,
    un-copyedited version of an article accepted for publication/published\r\nin Journal
    of Instrumentation. IOP Publishing Ltd is not responsible for any errors or omissions
    in this version of the manuscript or\r\nany version derived from it. The Version
    of Record is available online at https://doi.org/10.1088/1748-0221/19/05/c05042"
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo

start_date: 2024-05-20
end_date: 2025-05-20

## Journal

- title: Journal of Instrumentation
  issn: '17480221'
  volume: '19'

## Conference



## Related item



## Funding

- identifier: 21K18635
  funder_name: JSPS KAKENHI
- identifier: '23H01191 '
  funder_name: JSPS KAKENHI

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 61474fab-45a9-45fd-85af-7a7dbc16b1b7
  filename: Togawa Upload jinst-latex-sample.pdf
  content_type: application/pdf
  size: 626523
  md5: 1be12103f2427f28fb7c2f25d3f5c068

## Thumbnail

fileset_id: 61474fab-45a9-45fd-85af-7a7dbc16b1b7
filename: Togawa Upload jinst-latex-sample.pdf