# Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography

https://mdr.nims.go.jp/datasets/171f592b-d905-4703-8d65-bb5e0a27b884

## File

- [66_MT-D2024005.pdf](https://mdr.nims.go.jp/filesets/e284cea8-e9b1-4f34-9e7d-6143a7951af7/download) ([Detail](https://mdr.nims.go.jp/filesets/e284cea8-e9b1-4f34-9e7d-6143a7951af7.md))

## Id

171f592b-d905-4703-8d65-bb5e0a27b884

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-12-25T02:39:37.620620Z

## Updated at

2025-01-08T07:31:18.945348Z

## Published at

2025-01-08T07:31:19.025313Z

## Doi



## First published url

https://doi.org/10.2320/matertrans.mt-d2024005

## Date published

2025-01-01

## Recorded date published

2025

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si
    Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom
    Probe Tomography
  title_type: original
  lang: en

## Description

- description: The strength of Cu-Ni-Si alloy can be improved by finely dispersing
    Ni-Si-based compounds as precipitates into the Cu matrix through heat treatment.
    To investigate the strengthening effect of the precipitate, quantitative evaluation
    of the size distribution and dispersion state is necessary. In this work, we utilized
    transmission electron microscopy, small-angle X-ray scattering (SAXS), small-angle
    neutron scattering (SANS), and atom probe tomography (APT) to analyze these Ni-Si
    precipitates. The APT results showed two types of diffusion layers at the interface
    between the Cu matrix and precipitates. The alloy contrast variation method based
    on the difference in SAXS and SANS intensity in absolute units also suggests that
    the δNi2Si precipitates are distorted.
  description_type: abstract
  lang: und

## Creator

- name: Hirokazu Sasaki
  role: author
- name: Syunta Akiya
  role: author
- name: Kuniteru Mihara
  role: author
- name: Yojiro Oba
  role: author
- name: Masato Onuma
  role: author
- name: Jun Uzuhashi
  role: author
  orcid: https://orcid.org/0000-0003-2023-8158
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26
- name: Tadakatsu Ohkubo
  role: author
  orcid: https://orcid.org/0000-0003-3548-1951
  organization: National Institute for Materials Science
  ror: https://ror.org/026v1ze26

## Contact agent



## Publisher

organization: Japan Institute of Metals

## Managing organization



## Keyword

- subject: atom probe tomography
  schema: not_defined

## Rights

- description: "© 2024  Journal  of  Japan  Institute  of  Copper"
  identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: MATERIALS TRANSACTIONS
  issn: '13475320'
  volume: '66'
  issue: '1'
  start_page: 44
  end_page: 49
  article_number: MT-D2024005

## Conference



## Related item



## Funding



## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: e284cea8-e9b1-4f34-9e7d-6143a7951af7
  filename: 66_MT-D2024005.pdf
  content_type: application/pdf
  size: 2419586
  md5: 4b9bd496ae671ea0b4e437253ed7d9cf

## Thumbnail

fileset_id: e284cea8-e9b1-4f34-9e7d-6143a7951af7
filename: 66_MT-D2024005.pdf