# XAFS spectrum of Tin(II) oxide

https://mdr.nims.go.jp/datasets/16089a9d-08c8-40ce-9ce7-61c8ecf63fb9

## File

- [Sn-K_SnO_Si111_50ms_170616_fe.txt](https://mdr.nims.go.jp/filesets/5fac4dd1-03dc-47d3-988a-704c9cc7a5cc/download) ([Detail](https://mdr.nims.go.jp/filesets/5fac4dd1-03dc-47d3-988a-704c9cc7a5cc.md))
- [metadata.all.json](https://mdr.nims.go.jp/filesets/62e359f7-49cf-46cb-a0df-463de3b3ad82/download) ([Detail](https://mdr.nims.go.jp/filesets/62e359f7-49cf-46cb-a0df-463de3b3ad82.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/7f35a628-8f50-4ce1-8d7c-1d320b540e4b/download) ([Detail](https://mdr.nims.go.jp/filesets/7f35a628-8f50-4ce1-8d7c-1d320b540e4b.md))
- [Sn-K_SnO_Si111_50ms_170616_fe.ex3](https://mdr.nims.go.jp/filesets/a9d99204-75d2-4a0a-975d-7180316ac47e/download) ([Detail](https://mdr.nims.go.jp/filesets/a9d99204-75d2-4a0a-975d-7180316ac47e.md))
- [Sn-K_SnO_Si111_50ms_170616.dat](https://mdr.nims.go.jp/filesets/dc02a7af-a75b-4db4-ac5f-0fab9b10879d/download) ([Detail](https://mdr.nims.go.jp/filesets/dc02a7af-a75b-4db4-ac5f-0fab9b10879d.md))
- [Sn-K_SnO_Si111_50ms_170616.txt](https://mdr.nims.go.jp/filesets/69dbcbbc-9843-47e6-9f64-0ee464703afd/download) ([Detail](https://mdr.nims.go.jp/filesets/69dbcbbc-9843-47e6-9f64-0ee464703afd.md))
- [Sn-K_SnO_Si111_50ms_170616.ex3](https://mdr.nims.go.jp/filesets/43dea22b-f95a-4501-bcc4-35633f67152d/download) ([Detail](https://mdr.nims.go.jp/filesets/43dea22b-f95a-4501-bcc4-35633f67152d.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/89c2757f-614b-45c0-8f47-d4e60c447313/download) ([Detail](https://mdr.nims.go.jp/filesets/89c2757f-614b-45c0-8f47-d4e60c447313.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/ad29c892-6439-4c2b-8cdf-eb753c9fffc6/download) ([Detail](https://mdr.nims.go.jp/filesets/ad29c892-6439-4c2b-8cdf-eb753c9fffc6.md))
- [SnO.thumb.png](https://mdr.nims.go.jp/filesets/b548ea52-1d9f-474a-a483-f1b735fbf1da/download) ([Detail](https://mdr.nims.go.jp/filesets/b548ea52-1d9f-474a-a483-f1b735fbf1da.md))

## Id

16089a9d-08c8-40ce-9ce7-61c8ecf63fb9

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:38:52.485344Z

## Updated at

2025-05-02T12:37:42.096105Z

## Published at

2021-08-12T16:08:35.947168Z

## Doi

https://doi.org/10.48505/nims.2690

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-21

## Recorded date published

21/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Tin(II) oxide
  title_type: original
  lang: en
- title: spring8.561f38eb-eacb-48ee-96f7-73903a3ae5a7
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Sn K-edge of Tin(II) oxide measured at SPring-8 BL14B2, and is a part of XAFS
    database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of
    MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: XAFS
  schema: not_defined
- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: SnO
  schema: not_defined
- subject: Sn K-edge
  schema: not_defined
- subject: Oxide
  schema: not_defined
- subject: Tin(II) oxide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2017-06-16T20:38:00Z'

## Specimen

- name: Tin(II) oxide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735
  material_type_description: Oxide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1703

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2537
  description: Sn K-edge

## Software



## Custom property



## Fileset

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## Thumbnail

fileset_id: b548ea52-1d9f-474a-a483-f1b735fbf1da
filename: SnO.thumb.png