@misc{shunsuke2024a,
  title = {Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging},
  author = {Shunsuke Yamashita, Sei Fukushima, Jun Kikkawa, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo},
  publisher = {AIP Publishing},
  year = {2024-03-01},
  keywords = {defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES}
}