# A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions

https://mdr.nims.go.jp/datasets/13b0ff7d-90c8-44e1-aa4c-5272327f57dc

## File

- [REI2025_NIMB2026_1-s2.0-S0168583X26002260-main.pdf](https://mdr.nims.go.jp/filesets/135aad0e-c585-4554-a476-83a5d8f0bfbb/download) ([Detail](https://mdr.nims.go.jp/filesets/135aad0e-c585-4554-a476-83a5d8f0bfbb.md))

## Id

13b0ff7d-90c8-44e1-aa4c-5272327f57dc

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-06-18T05:19:49.670344Z

## Updated at

2026-06-18T05:50:54.282742Z

## Published at

2026-06-18T07:28:55.277628Z

## Doi



## First published url

https://doi.org/10.1016/j.nimb.2026.166225

## Date published

2026-06-17

## Recorded date published

2026-10

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: A model reasoning low-energy track-formation and enhanced nuclear energy
    loss in Si irradiated with C60 ions
  title_type: original
  lang: en

## Description

- description: Ion energy dependence of track radius in Si was investigated under
    C60 ion irradiation between 30 keV and 9 MeV. The tracks were observed from 9
    MeV down to 60 keV but not at 30 keV. The track radius gradually decreased with
    decreasing the energy from 9 MeV to 500 keV, showing a tentative increase around
    300 keV followed by further decrease. Both (i) the track formation at exceptionally
    low energies and (ii) the non-monotonic energy dependence of the track radius,
    are explained by the ion energy dependence of electronic and nuclear energy losses
    of C60 ions in Si, i.e., the cluster-ion energy loss (CIEL) model.
  description_type: abstract
  lang: und

## Creator

- name: H. Amekura
  role: author
  orcid: https://orcid.org/0000-0003-2148-8431
- name: K. Narumi
  role: author
  orcid: https://orcid.org/0000-0001-8569-0108
- name: A. Chiba
  role: author
- name: Y. Hirano
  role: author
- name: K. Yamada
  role: author
- name: S. Yamamoto
  role: author
- name: Y. Saitoh
  role: author
- name: H. Segawa
  role: author
  orcid: https://orcid.org/0000-0002-7198-8410

## Contact agent



## Publisher

organization: National Institute for Materials Science
ror: https://ror.org/

## Managing organization



## Keyword

- subject: ion track
  schema: not_defined
- subject: C60 ion
  schema: not_defined
- subject: Silicon
  schema: not_defined
- subject: Synergy effect
  schema: not_defined
- subject: Cluster effect
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: 'Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions
    with Materials and Atoms'
  issn: '0168583X'
  volume: '579'
  article_number: '166225'

## Conference



## Related item



## Funding

- identifier: 25K08531
  funder_name: Japan Society for the Promotion of Science
  description: 疑似核分裂片としてのMeV-C60イオンで解明するトラック型損傷形成機構

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 135aad0e-c585-4554-a476-83a5d8f0bfbb
  filename: REI2025_NIMB2026_1-s2.0-S0168583X26002260-main.pdf
  content_type: application/pdf
  size: 1443875
  md5: 7035f656fe0871dd49e95049e40e199a

## Thumbnail

fileset_id: 135aad0e-c585-4554-a476-83a5d8f0bfbb
filename: REI2025_NIMB2026_1-s2.0-S0168583X26002260-main.pdf