Taoufiq Ouaj
;
Christophe Arnold
;
Jon Azpeitia
;
Sunaja Baltic
;
Julien Barjon
;
José Cascales
;
Huanyao Cun
;
David Esteban
;
Mar Garcia-Hernandez
;
Vincent Garnier
;
Subodh K Gautam
;
Thomas Greber
;
Said Said Hassani
;
Adrian Hemmi
;
Ignacio Jiménez
;
Catherine Journet
;
Paul Kögerler
;
Annick Loiseau
;
Camille Maestre
;
Marvin Metzelaars
;
Philipp Schmidt
;
Christoph Stampfer
;
Ingrid Stenger
;
Philippe Steyer
;
Takashi Taniguchi
;
Bérangère Toury
;
Kenji Watanabe
;
Bernd Beschoten
説明:
(abstract)We present a benchmarking protocol that combines the characterization of boron nitride crystals and films with the evaluation of the electronic quality of graphene on these substrates. Our study includes hBN crystals grown under different conditions (atmospheric pressure high temperature, pressure controlled furnace) and scalable BN films deposited by either chemical or physical vapor deposition (CVD or PVD). We explore the complete process from boron nitride growth, over its optical characterization by time-resolved cathodoluminescence (TRCL), to the optical and electronic characterization of graphene by Raman spectroscopy after encapsulation and Hall bar processing. Within our benchmarking protocol we achieve a homogeneous electronic performance within each Hall bar device through a fast and reproducible processing routine. We find that a free exciton lifetime of 1ns measured on as-grown hBN crystals by TRCL is sufficient to achieve high graphene room temperature charge carrier mobilities of 80, 000 cm2 /(Vs) at a carrier density of |n| = 1 × 1012 cm−2 , while re- spective exciton lifetimes around 100ps yield mobilities up to 30,000cm2/(Vs). For scalable PVD-grown BN films, we measure carrier mobilities exceeding 10,000cm2/(Vs) which correlates with a graphene Raman 2D peak linewidth of 22cm−1. Our work highlights the importance of the Raman 2D linewidth of graphene as a critical metric that effectively assesses the interface quality (i.e. surface roughness) to the BN substrate, which directly affects the charge carrier mobility of graphene. Graphene 2D linewidth analysis is suitable for all BN substrates and is particularly advantageous when TRCL or Raman spectroscopy cannot be applied to specific BN materials such as amorphous or thin films. This underlines its superior role in the evaluation of BN crystals and films for the use of high-mobility graphene devices.
権利情報:
キーワード: Boron nitride, electronic properties, graphene
刊行年月日: 2025-01-01
出版者: IOP Publishing
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1088/2053-1583/ad96c9
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-02-03 12:30:33 +0900
MDRでの公開時刻: 2025-02-03 12:30:33 +0900
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Ouaj_2025_2D_Mater._12_015017.pdf
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サイズ | 3.16MB | 詳細 |