# Study of device characteristics of intrinsic Josephson junction terahertz emitters related to annealing conditions of the crystals

https://mdr.nims.go.jp/datasets/0f05df4d-85df-4fa3-8516-1a7ff6dde5a5

## File

- [JApplPhys133_163904.pdf](https://mdr.nims.go.jp/filesets/46d26359-8b92-47a5-960f-192d49e89fa9/download) ([Detail](https://mdr.nims.go.jp/filesets/46d26359-8b92-47a5-960f-192d49e89fa9.md))

## Id

0f05df4d-85df-4fa3-8516-1a7ff6dde5a5

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2023-12-17T07:14:27.793846Z

## Updated at

2024-11-12T02:51:15.550654Z

## Published at

2024-04-26T23:30:14.679220Z

## Doi



## First published url

https://doi.org/10.1063/5.0137830

## Date published

2023-04-28

## Recorded date published

2023-4-28

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Study of device characteristics of intrinsic Josephson junction terahertz
    emitters related to annealing conditions of the crystals
  title_type: original
  lang: en

## Description

- description: We fabricated terahertz (THz) wave emitters from high-temperature superconductor
    Bi2 Sr2 CaCu2 O8þδ (Bi2212) single crystals annealed under oxygen gas (O2) flow
    and nitrogen gas (N2) flow conditions. To better understand the annealing effects
    of the crystal for the device, we evaluated both device properties and a c-axis
    lattice constant using x-ray diffraction. Compared to the N2-annealed sample,
    the O2-annealed sample shows higher critical current in the current–voltage characteristics
    and no clear emission. In addition, multiple hystere- sis loops were observed
    above 75 K. Based on the x-ray diffraction measurements, it is suggested that
    the presence of multiple hysteresis loops observed in the I–V characteristics
    of the O2-annealed sample is caused by the existence of layers that have varying
    levels of oxygen content along the c-axis direction of the crystal. The formation
    of these layers is attributed to the deposition process of metallic thin films
    during the device fabrication procedure. This result indicates that the Bi2212
    crystal surface of the O2-annealed sample is more sensitive than that of the N2-annealed
    one. The information is useful for preparing the Bi2212 crystals for THz-wave
    emitting devices.
  description_type: abstract
  lang: eng

## Creator

- name: S. Nakagawa
  role: author
  orcid: https://orcid.org/0000-0003-4539-6953
- name: T. Shizu
  role: author
- name: T. Imai
  role: author
- name: M. Nakayama
  role: author
- name: J. Kim
  role: author
- name: H. Minami
  role: author
  orcid: https://orcid.org/0000-0003-4884-3560
- name: K. Kadowaki
  role: author
  orcid: https://orcid.org/0000-0001-9391-1150
- name: M. Tsujimoto
  role: author
  orcid: https://orcid.org/0000-0003-4296-5137
- name: H. Nakao
  role: author
  orcid: https://orcid.org/0000-0003-4020-537X
- name: H. Eisaki
  role: author
  orcid: https://orcid.org/0000-0002-8299-6416
- name: S. Ishida
  role: author
  orcid: https://orcid.org/0000-0001-9445-8079
- name: T. Mochiku
  role: author
  orcid: https://orcid.org/0000-0003-2208-4279
  organization: National Institute for Materials Science
- name: Y. Hasegawa
  role: author
  orcid: https://orcid.org/0000-0002-6674-4745
- name: T. Kashiwagi
  role: author
  orcid: https://orcid.org/0000-0002-4839-9247

## Contact agent

- orcid: https://orcid.org/
  ror: https://ror.org/

## Publisher

organization: AIP Publishing

## Managing organization



## Keyword

- subject: Josephson junction
  schema: not_defined
- subject: terahertz emitter
  schema: not_defined
- subject: high-temperature superconductor
  schema: not_defined
- subject: annealing condition
  schema: not_defined
- subject: Bi2 Sr2 CaCu2 O8
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo

start_date: 2023-04-27
end_date: 2024-04-27

## Journal

- title: JOURNAL OF APPLIED PHYSICS
  issn: '10897550'
  volume: '133'
  issue: '16'
  start_page: 1
  end_page: 8
  article_number: '163904'

## Conference



## Related item



## Funding

- identifier: 15H01996
  funder_name: Japan Society for the Promotion of Science
- identifier: 17K05018
  funder_name: Japan Society for the Promotion of Science
- identifier: 20H02590
  funder_name: Japan Society for the Promotion of Science
- identifier: 2018-43
  funder_name: TIA-kakehashi grants
- identifier: 2019-47
  funder_name: TIA-kakehashi grants

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



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## Fileset

- id: 46d26359-8b92-47a5-960f-192d49e89fa9
  filename: JApplPhys133_163904.pdf
  content_type: application/pdf
  size: 2916407
  md5: 9dde1a0f0147421649416c2349150c5b

## Thumbnail

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filename: JApplPhys133_163904.pdf