# X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析

https://mdr.nims.go.jp/datasets/0c414045-bdef-4a43-a474-37a7b0945fdc

## File

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## Id

0c414045-bdef-4a43-a474-37a7b0945fdc

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2023-11-13T01:25:19.542356Z

## Updated at

2024-01-30T00:51:05.509398Z

## Published at

2024-01-30T03:30:14.633781Z

## Doi

https://doi.org/10.48505/nims.4326

## First published url

https://doi.org/10.34562/jic.62.1_85

## Date published



## Recorded date published



## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
  title_type: original
  lang: ja
- title: Characterization of δNi2Si precipitates in Cu-Ni-Si alloy by small angle
    x-ray scattering, small angle neutron scattering and atom probe tomography
  title_type: alternative
  lang: en

## Description

- description: The strength of Cu-Ni-Si alloy can be improved by finely dispersing
    a Ni-Si-based compound as a precipitate into the Cu parent phase by heat treatment.
    In order to investigate the strengthening effect of the precipitate, quantitative
    evaluation of the size distribution and dispersion state is necessary. In this
    work, we utilized transmission electron microscopy, small-angle X-ray scattering
    (SAXS), small-angle neutron scattering (SANS), and atom probe tomography to analyze
    this Ni-Si precipitated phase. The atom probe tomography results showed two types
    of the diffusion layers at the interface between the Cu parent phase and the precipitated
    phases. The alloy contrast variation method based on the difference of SAXS and
    SANS intensity in absolute units suggests that the δNi2Si precipitates are distorted.
  description_type: abstract
  lang: jpn

## Creator

- name: 佐々木 宏和
  role: author
  organization: 古河電気工業株式会社
- name: 秋谷 俊太
  role: author
  organization: 古河電気工業株式会社
- name: 三原 邦照
  role: author
  organization: 古河電気工業株式会社
- name: 大場 洋次郎
  role: author
  organization: 豊橋技術科学大学
- name: 大沼 正人
  role: author
  organization: 北海道大学
- name: 埋橋 淳
  role: author
  orcid: https://orcid.org/0000-0003-2023-8158
  organization: 物質・材料研究機構
- name: 大久保 忠勝
  role: author
  orcid: https://orcid.org/0000-0003-3548-1951
  organization: 物質・材料研究機構

## Contact agent



## Publisher

organization: 日本銅学会

## Managing organization



## Keyword

- subject: atom probe tomography
  schema: not_defined
- subject: transmission electron microscopy
  schema: not_defined
- subject: Corson alloy
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Journal of Japan Institute of Copper
  issn: '13477234'
  volume: '62'
  issue: '1'
  start_page: 85
  end_page: 89

## Conference



## Related item



## Funding



## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 4b6507bc-ce4d-4107-9456-437e5cd05fb5
  filename: X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf
  content_type: application/pdf
  size: 969187
  md5: ebc174138388a048f2dde9a26a60f0f5

## Thumbnail

fileset_id: 4b6507bc-ce4d-4107-9456-437e5cd05fb5
filename: X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf