# Ptychographical reconstruction code by Wigner Distribution Deconvolution （WDD）

https://mdr.nims.go.jp/datasets/0b2d3761-5a37-4b85-b988-b487431778b6

## File

- [Ptychography reconstruction by WDD method and aberration measurement_user guide..ipynb](https://mdr.nims.go.jp/filesets/e5dd9db3-5814-448a-b0ab-a06c275a6e27/download) ([Detail](https://mdr.nims.go.jp/filesets/e5dd9db3-5814-448a-b0ab-a06c275a6e27.md))
- [Ptychography.py](https://mdr.nims.go.jp/filesets/e52826ff-5356-4fb8-af6d-32cd29460593/download) ([Detail](https://mdr.nims.go.jp/filesets/e52826ff-5356-4fb8-af6d-32cd29460593.md))
- [stem4d.py](https://mdr.nims.go.jp/filesets/6e72cb17-8111-4ee8-b061-0195899d4043/download) ([Detail](https://mdr.nims.go.jp/filesets/6e72cb17-8111-4ee8-b061-0195899d4043.md))
- [Si110_7x5_128.tif](https://mdr.nims.go.jp/filesets/bf1d8b9c-e382-4ea6-a178-68de6dd3739e/download) ([Detail](https://mdr.nims.go.jp/filesets/bf1d8b9c-e382-4ea6-a178-68de6dd3739e.md))

## Id

0b2d3761-5a37-4b85-b988-b487431778b6

## Local identifier

identifier: mdr-schema-yaml/b8515r82f

## Visibility

open_to_public

## State

published

## Created at

2023-01-31T11:08:39.686210Z

## Updated at

2023-02-03T08:43:11.626134Z

## Published at

2023-02-06T02:52:38.839180Z

## Doi

https://doi.org/10.48505/nims.3859

## First published url

https://github.com/Kazu32143952/Ptychography-reconstruction-by-WDD-method-and-aberration-measurement

## Date published

2022-11-30

## Recorded date published



## Resource type

software

## Manuscript type

na

## Collection



## Title

- title: Ptychographical reconstruction code by Wigner Distribution Deconvolution
    （WDD）
  title_type: original

## Description

- description: "Codes for Ptychographical reconstruction by WDD method and aberration
    measuremnt.\r\n\r\nThe codes were originally developed by Katsuaki Nakazawa(ICYS
    fellow at NIMS Japan) and debugged and modified by Kazutaka Mitsuishi (NIMS Japan)
    based on the following papers and books:\r\n\r\nPennycook, T. J. et al. Efficient
    phase contrast imaging in STEM using a pixelated detector. Part 1: experimental
    demonstration at atomic resolution. Ultramicroscopy 151, 160-167, doi:10.1016/j.ultramic.2014.09.013
    (2015). Yang, H. et al. Simultaneous atomic-resolution electron ptychography and
    Z-contrast imaging of light and heavy elements in complex nanostructures. Nat
    Commun 7, 12532, doi:10.1038/ncomms12532 (2016). Rodenburg, J. & Maiden, A.
    in Springer handbook of microscopy (eds P. W. Hawkes & John C. H. Spence)
    Ch. 17, (Springer Nature, 2019). Rodenburg, J. M. Advances in Imaging and Electron
    Physics 87-184 (2008).\r\n\r\nDisclaimer THE SOFTWARE IS PROVIDED \"AS IS\", WITHOUT
    WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES
    OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO
    EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES
    OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING
    FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN
    THE SOFTWARE."
  description_type: abstract
  lang: und

## Creator

- name: Nakazawa Katsuaki
  role: author
  orcid: https://orcid.org/0000-0002-6056-5615
  organization: National Institute for Materials Science
  department: ICYS
  ror: https://ror.org/026v1ze26
- name: Mitsuishi Kazutaka
  role: author
  orcid: https://orcid.org/0000-0002-9361-4057
  organization: National Institute for Materials Science
  department: Research Center for Advanced Measurement and Characterization
  ror: https://ror.org/026v1ze26

## Contact agent

- name: Mitsuishi Kazutaka
  email: Mitsuishi.Kazutaka@nims.go.jp
  organization: National Institute for Materials Science
  department: Research Center for Advanced Measurement and Characterization

## Publisher

organization: National Institute for Materials Science
ror: https://ror.org/026v1ze26

## Managing organization

organization: 0 ~ National Institute for Materials Science

## Keyword

- subject: ptychography
  schema: not_defined
- subject: 4DSTEM
  schema: not_defined
- subject: electron microscopy
  schema: not_defined
- subject: Wigner distribution deconvolution
  schema: not_defined
- subject: aberration correction
  schema: not_defined

## Rights

- description: MIT License
  identifier: http://opensource.org/licenses/MIT

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Scientific reports
  issn: '20452322'
  volume: '13'
  issue: '1'
  start_page: 316
  article_number: 10.1038/s41598-023-27452-3

## Conference



## Related item



## Funding

- identifier: 21K04890
  funder_name: 日本学術振興会
  description: 基盤研究（C）

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method

- category_vocabulary: https://matvoc.nims.go.jp/entity/Q45
  description: microscopy -- scanning transmission electron microscopy

## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: e5dd9db3-5814-448a-b0ab-a06c275a6e27
  filename: Ptychography reconstruction by WDD method and aberration measurement_user
    guide..ipynb
  content_type: application/octet-stream
  size: 906285
  md5: 10ecab9ee3c3b67fb3085c4109b79ede
- id: e52826ff-5356-4fb8-af6d-32cd29460593
  filename: Ptychography.py
  content_type: text/troff
  size: 30807
  md5: 1635c22c4554827205a558335ed3110c
- id: 6e72cb17-8111-4ee8-b061-0195899d4043
  filename: stem4d.py
  content_type: text/troff
  size: 4708
  md5: e3e47ad5663d6da670360f05f9ddb235
- id: bf1d8b9c-e382-4ea6-a178-68de6dd3739e
  filename: Si110_7x5_128.tif
  content_type: image/tiff
  size: 85422
  md5: 4861a292ad868f9de3735aff76f43234

## Thumbnail

fileset_id: 6e72cb17-8111-4ee8-b061-0195899d4043
filename: stem4d.py