# Multiscale structural analysis of defective graphene in transmission electron microscopy images using persistent homology

https://mdr.nims.go.jp/datasets/068cef3f-7ebb-40db-adb8-c3f9386b11a4

## File

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## Id

068cef3f-7ebb-40db-adb8-c3f9386b11a4

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-06-08T04:48:16.297850Z

## Updated at

2026-06-08T06:40:00.531586Z

## Published at

2026-06-08T10:26:44.850158Z

## Doi



## First published url

https://doi.org/10.1063/5.0305461

## Date published

2026-01-01

## Recorded date published

2026-1-1

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Multiscale structural analysis of defective graphene in transmission electron
    microscopy images using persistent homology
  title_type: original
  lang: en

## Description

- description: We developed a persistent-homology-based strategy that converts transmission
    electron microscopy images of defective graphene into quantitative, multiscale
    descriptors spanning local carbon-atom polygons and their global connectivity.
    Zero-dimensional persistence diagrams for grayscale images extracted carbon-ring
    interiors as local structures, allowing identification of defect structures. Roundness
    as a measure of the distortion of carbon rings and polygon number were quantitatively
    calculated. It was found that electron irradiation increased both the fraction
    of non-hexagonal polygons and distortion of carbon-atom polygons in graphene.
    One-dimensional persistence diagrams for polygon-center point clouds after downsampling
    the center of non-hexagonal polygons yielded large rings that reliably enclosed
    connected defect clusters ranging from simple defects to complex clusters. These
    rings also enclosed non-crystalline regions composed of hexagons, which were difficult
    to capture considering only polygon number. The large rings enable automated counting
    of the number of each type of polygon within each defect cluster. The number of
    polygons within defect clusters thereby quantified the connectivity of carbon-atom
    polygons and revealed that electron-beam irradiation induced the growth of defect
    clusters in an interconnected manner.
  description_type: abstract
  lang: und

## Creator

- name: Ryuto Eguchi
  role: author
  orcid: https://orcid.org/0009-0003-2859-6934
  organization: National Institute for Materials Science
- name: Ayako Hashimoto
  role: author
  orcid: https://orcid.org/0000-0002-1985-7667
  organization: National Institute for Materials Science

## Contact agent



## Publisher

organization: AIP Publishing
ror: https://ror.org/

## Managing organization



## Keyword

- subject: Electron microsocopy
  schema: not_defined
- subject: Persistent homology
  schema: not_defined
- subject: Graphene
  schema: not_defined
- subject: In situ observation
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2026-01-20

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: APL Materials
  issn: 2166532X
  volume: '14'
  issue: '1'
  article_number: '011108'

## Conference



## Related item



## Funding

- identifier: JPMJFR213U
  funder_name: Fusion Oriented Research for Disruptive Science and Technology
- identifier: JPMJPR17S7
  funder_name: Precursory Research for Embryonic Science and Technology
- identifier: JPMXP1225NM5101
  funder_name: Advanced Research Infrastructure for Materials and Nanotechnology in
    Japan
- identifier: JPMXP1225NM5102
  funder_name: Advanced Research Infrastructure for Materials and Nanotechnology in
    Japan

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



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## Process for specimen treatment



## Computational method



## Energy level/transition state



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## Fileset

- id: e5ec5b83-3efa-45b0-bec4-796d656c9473
  filename: 26-Eguchi-APLMaterials14-011108.pdf
  content_type: application/pdf
  size: 13880319
  md5: 3f030ad169aac60428908f3aef249acc
- id: b8aeec97-bc2d-4586-a809-8bb7cdca435f
  filename: 26-Eguchi-APLMaterials14-011108-SI.pdf
  content_type: application/pdf
  size: 2027287
  md5: b16cfeb84c33679bee6ae16c8358c678

## Thumbnail

fileset_id: e5ec5b83-3efa-45b0-bec4-796d656c9473
filename: 26-Eguchi-APLMaterials14-011108.pdf