Publication

Depth sectioning using environmental and atomic-resolution STEM

MDR Open Deposited
Analytics

Downloadable Content

Download PDF
Download This Work (Zip)
Citations

Depth-sectioning Scanning TEM (STEM) is a promising technique that enhances the signal for a sample embedded in a matrix. It can increase the resolution to the atomic level, thereby enabling EC-STEM applications in important areas. This review introduces depth-sectioning STEM and its applications to high-resolution EC-STEM imaging of samples in gases and liquids.

DOI
First published at
Creator
Keyword
Resource type
Publisher
Date published
  • 22/01/2024
Rights statement
License description
Journal
  • Title
    Microscopy
    ISSN
    20505701
    Volume
    73
    Issue
    2
    Start page
    145
    End page
    153
Manuscript type
  • Accepted manuscript
Language
Funding reference
  • Funder identifier
    JPMJPR17S7
    Funder name
    Precursory Research for Embryonic Science and Technology
    Funder identifier
    JPMJTM20KU
    Funder name
    Adaptable and Seamless Technology Transfer Program through Target-Driven R and D
    Funder identifier
    JPJ004596
    Funder name
    Acquisition, Technology & Logistics Agency
    Funder identifier
    JPMJPR17S7
    Funder name
    Precursory Research for Embryonic Science and Technology
    Funder identifier
    JPMJTM20KU
    Funder name
    Adaptable and Seamless Technology Transfer Program through Target-Driven R and D
    Funder identifier
    21K05248
    Funder name
    Japan Society for the Promotion of Science
    Funder identifier
    21K05248
    Funder name
    Japan Society for the Promotion of Science
    Funder identifier
    JPJ004596
    Funder name
    Acquisition, Technology & Logistics Agency

Items

Thumbnail Title Date Uploaded Size Visibility Actions
Microscopy_Takeguchi et al. Depth-sectioning technique.pdf 3.01 MB MDR Open