Analysis of degradation kinetics of halide perovskite solar cells induced by light and heat stress

The operational stability of encapsulated perovskite solar cells (PSCs) is imperative for commercialization. Here, we have investigated the degradation of PSCs with organic (PTAA) and inorganic (NiOx) HTLs under constant illumination and thermal stress. The device parameters under 1-sun illumination were monitored over time at different temperatures; 20–85 °C. The temperature-dependent device parameters analysis showed a lower value of degradation activation energy (EA) for the device with the PTAA (∼0.274 0.05 eV) than that for the NiOx device (∼0.495 0.05 eV). This result corroborates that higher activation energy for NiOx/HaP devices leads to superior device stability. The device degradation kinetic has been discussed by adopting the Arrhenius model with temperature and humidity prefactor correction associated with structural defects in the bulk and interfacial deterioration. Our analysis underscores the importance of the layer material's stability against humidity and thermal stress for the device stability correlating degradation activation energy and stress prefactor.