Dataset
Sample data for X-ray visualization of local bending of the lattice planes (XR-V-LBLP)
MDR Open Deposited
We have improved synchrotron X-ray diffraction imaging, a type of X-ray diffraction topography (XRDT), and have proposed a new method to visualize the local bending of lattice planes (XR-V-LBLP). Data can be used to perform calculations for the proposed method. Data contain two or more reflections at different azimuthal angles of the sample, and each azimuthal data contains two-dimensional diffraction images of the substrate obtained by rotating the angle of incidence. Please see the attached file for more details.
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- 27/03/2023
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Items
Thumbnail | Title | Date Uploaded | Size | Visibility | Actions |
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GaN_n1_4_0.zip | 959 MB | MDR Open |
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GaN_n1_4_120.zip | 1010 MB | MDR Open |
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GaN_n1_4_m120.zip | 817 MB | MDR Open |
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GaN_n2_2_0.zip | 104 MB | MDR Open |
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GaN_n2_2_120.zip | 104 MB | MDR Open |
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GaN_n3_m_0.zip | 295 MB | MDR Open |
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GaN_n3_m_90.zip | 262 MB | MDR Open |
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README.pdf | 161 KB | MDR Open |
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schematic of the data contained in the folders.PNG | 75.6 KB | MDR Open |
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