%0 Dataset %T XAFS spectrum of Tin(IV) oxide %8 20/06/2022 %U https://mdr.nims.go.jp/concern/datasets/pr76f717m %R https://doi.org/10.48505/nims.3466 %X This dataset consists of X-ray absorption fine structure (XAFS) spectra at Sn K-edge of Tin(IV) oxide measured at PF, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR %9 Dataset %K Hokkaido University, Institute for Catalysis; Oxide; Si(311); Sn K-edge; SnO2; Tin(IV) oxide; XAFS; collection - MDR XAFS DB %~ MDR: NIMS Materials Data Repository %W National Institute for Materials Science