%0 Dataset %T XAFS spectrum of Tantalum nitride %8 24/07/2021 %U https://mdr.nims.go.jp/concern/datasets/76537397h %R https://doi.org/10.48505/nims.2925 %X This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L21-edge of Tantalum nitride measured at SPring-8 BL14B2, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR %9 Dataset %K BL14B2; Nitride; SPring-8; Si(111); Ta L21-edge; TaN; Tantalum nitride; XAFS; collection - MDR XAFS DB %~ MDR: NIMS Materials Data Repository %W National Institute for Materials Science