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"YOSHIKAWA, Hideki"
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材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
Description/Abstract:
In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:
研究データ
,
データフロー
,
相互利用 FAIR
,
材料データプラットフォーム DICE
,
データ リポジトリ
,
メタデータスキーマ
, and
マテリアル・インフォマティクス
Resource Type:
Article
Author:
TANIFUJI, Mikiko
and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
25/08/2021
Date Modified:
25/08/2021
材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤
Description/Abstract:
材料分野でのデータ駆動型の材料研究の進展のため、物質 ・ 材料研究機構(National Institute for Materials Science, NIMS)は材料データプラットフォームシステムの開発に2017年に着手し、2020年からサービス名 DICE として所...
Keyword:
研究データ
,
データフロー
,
FAIR
,
DICE
,
マテリアル・インフォマティクス
,
語彙管理
, and
データ構造化
Resource Type:
Presentation
Author:
TANIFUJI, Mikiko
,
MATSUDA, Asahiko
, and
YOSHIKAWA, Hideki
Date Uploaded:
02/03/2022
Date Modified:
02/03/2022
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために,極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った.その...
Keyword:
Auger Depth Profiling Analysis
,
Ultra Low Angle Incidence Ion Beam
, and
FeNi/CoFeB/FeNi Thin Film
Material/Specimen:
FeNi/CoFeB/FeNi Thin Film
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Yanagiuchi, Katsuaki
, and
Yoshikawa, Hideki
Journal:
Journal of Surface Analysis
Date Uploaded:
28/05/2021
Date Modified:
04/06/2021
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:
Auger Depth Profiling analysis
,
HfO2/Si
, and
Ultra Low Angle Incidence Ion Beam
Material/Specimen:
HfO2
Resource Type:
Article
Author:
Yoshikawa, Hideki
,
Ogiwara, Toshiya
, and
Nagata, Takahiro
Journal:
Journal of Surface Analysis
Date Uploaded:
25/05/2021
Date Modified:
26/05/2021
First-principles calculations of optical constants
Description/Abstract:
The energy loss function (ELF) describes the interaction between electrons and matter in solids. It is essential for understanding quanti...
Keyword:
compound semiconductor
,
energy loss function
,
first-principles calculation
, and
optical constant
Resource Type:
Dataset
Data origin:
simulations
Author:
SHINOTSUKA, Hiroshi
,
YOSHIKAWA, Hideki
, and
TANUMA, Shigeo
Journal:
e-Journal of Surface Science and Nanotechnology
Date Uploaded:
18/01/2021
Date Modified:
07/07/2021
Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as an IoT Device
Description/Abstract:
実験・計算・データ科学を融合させた材料の研究開発を推進するマテリアルズインフォマティクス(MI)が推進されているが、実験データの収集については既存データベースのインポートや出版済み論文のデータマイニングに限られる場合が多い。効果的な MI のためには各種装置から自動的に実験...
Keyword:
FlashAir
,
IoT
,
Wi-Fi
, and
data transfer
Resource Type:
Presentation
Author:
MATSUDA, Asahiko
,
YOSHIKAWA, Hideki
, and
CHIKYOW, Toyohiro
Date Uploaded:
23/10/2020
Date Modified:
01/07/2021
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
Description/Abstract:
We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to...
Keyword:
MED
,
asymmetry parameter
,
high-energy photoelectron spectroscopy
,
lnearly polarized X-rays
, and
mean escape depth
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Yoshikawa, Hideki
,
Shinotsuka, Hiroshi
, and
Ueda, Ryuichi
Journal:
Journal of Electron Spectroscopy and Related Phenomena
Date Uploaded:
26/06/2020
Date Modified:
02/07/2021
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
Description/Abstract:
It is very important to know details of the interactions of low-energy electron with liquid water for many biological applications. There...
Keyword:
IMFP
and
liquid water
Resource Type:
Presentation
Author:
TANUMA, Shigeo
,
SHINOTSUKA, Hiroshi
,
DA, Bo
,
YOSHIKAWA, Hideki
, and
パウエル
Date Uploaded:
29/06/2023
IoT データ収集システムのデータアーキテクチャ
Description/Abstract:
With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:
データアーキテクチャ
,
IoT
,
データ収集システム
,
メタデータ
, and
XML スキーマ
Resource Type:
Article
Author:
MATSUNAMI, Shigeyuki
,
MATSUDA, Asahiko
,
CHIKYOW, Toyohiro
,
HARADA, Yoshitomo
, and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
26/08/2021
Date Modified:
26/08/2021
電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討-, Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–
Description/Abstract:
電子線マイクロアナライザーは広く材料の分析に用いられ,定量分析法はZAF法としてほぼ確立されている.しかし,Mg-Ge合金においては,定量分析の結果MgとGeの濃度の合計120wt.% と異常な値を示した.しかも電子線の加速電圧が高くなるに従ってMgの定量値が上昇する.こ...
Keyword:
Mg-Ge alloy
,
ZAF
,
electron probe microanalyzer
, and
mass absorption coefficient
Resource Type:
Article
Author:
Nishio, Mitsuaki
,
Imai, Motoharu
,
Tanuma, Shigeo
,
Yoshikawa, HIdeki
, and
Isoda, Yukihiro
Journal:
Journal of Surface Analysis
Date Uploaded:
20/07/2020
Date Modified:
22/07/2020
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13
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The history of DICE and NIMS Digital Library
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2
liquid water
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7
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3
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Rights Statement Sim
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
5
Creative Commons BY Attribution 4.0 International
4
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4
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
1
Computational methods
density functional theory or electronic structure
1
Data origin
simulations
1
Properties addressed
electrical -- dielectric constant and spectra
1
optical
1
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FeNi/CoFeB/FeNi Thin Film
1
HfO2
1
Date accepted
2017
1
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2021
1
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2019
1
Author
YOSHIKAWA, Hideki
6
Yoshikawa, Hideki
6
MATSUDA, Asahiko
3
Shinotsuka, Hiroshi
3
Tanuma, Shigeo
3
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https://creativecommons.org/licenses/by-nc-nd/4.0/
3
https://creativecommons.org/licenses/by/4.0/
1
Journal
Journal of Surface Analysis
3
Journal of Electron Spectroscopy and Related Phenomena
2
情報処理学会論文誌デジタルプラクティス
2
Journal of Electron Spectroscopy and Related Phenomena
1
Surface and Interface Analysis
1
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