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Silicon nitride
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XAFS spectrum of Silicon nitride
Description/Abstract:
This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon nitride measured at Ritsumeikan-SR BL-10,...
Keyword:
BL-10
,
Nitride
,
Ritsumeikan-SR
,
Si K-edge
,
Si3N4
,
Silicon nitride
,
XAFS
, and
collection - MDR XAFS DB
Resource Type:
Dataset
Data origin:
experiments
Date Uploaded:
08/06/2022
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Type of work
Dataset
1
Collection
MDR XAFS DB
1
Keyword
BL-10
1
Nitride
1
Ritsumeikan-SR
1
Si K-edge
1
Si3N4
1
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Resource type
Dataset
1
Visibility
open
1
Rights Statement Sim
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International
1
Data origin
experiments
1
Characterization methods
spectroscopy -- x-ray absorption spectroscopy
1
Instrument manufacturer
Ritsumeikan SR Center
1
Instrument managing organization
Ritsumeikan University
1
Instrument managing sub organization
Ritsumeikan SR Center
1
Structural feature category
https://matvoc.nims.go.jp/entity/Q686
1