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1. Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction

Description/Abstract:: Position-dependent three-dimensional reciprocal space mapping (RSM) by nanobeam x-ray diffraction (nanoXRD) was performed to reveal the ...
Keyword:: Dislocation, GaN, and SPring-8
Resource Type:: Article
Author:: T. Hamachi, T. Tohei, Y. Hayashi, S. Usami, M. Imanishi, Y. Mori, K. Sumitani, Y. Imai, S. Kimura, and A. Sakai
Journal:: Journal of Applied Physics
Date Uploaded:: 04/12/2024

2. MDR HAXPES DB

Description/Abstract:: はじめに　MDR HAXPES DBは、硬X線光電子分光法（Hard X-ray Photoelectron spectroscopy, HAXPES）の広い利用を目的に、国立研究開発法人物質・材料研究機構（NIMS）にてHAXPESのスペクトルデータを編纂したもの...
Keyword:: HAXPES, SPring-8, and BL46XU
License:: Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International