Analysis of electron inelastic scattering in solids over wide energy range and its application to surface chemical analysis

Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection

Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging

Chemical Interface Structures in CdS/RbInSe₂/Cu(In,Ga)Se₂ Thin‐Film Solar Cell Stacks