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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Thermally Stable Mesoporous Poly(ether sulfone) Monoliths with Nanofiber Network Structures
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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金材技研ニュース 1990 No.1
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金材技研ニュース 1989 No.7
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金材技研ニュース 1989 No.12
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金材技研ニュース 1989 No.10
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金材技研ニュース 1989 No.11
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金材技研ニュース 1989 No.8
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金材技研ニュース 1989 No.9
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