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Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
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Monte Carlo tree search for materials design and discovery
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Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
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Optical fuse by carbon-coated TeO2 glass segment inserted in silica glass optical fiber circuit
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Mechanochromism of dynamic disulfide bonds as a chromophoric indicator of adhesion strength for epoxy adhesive
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Structure and pressure inside Xe nanoparticles embedded in Al
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Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Object-oriented virtual sample library: a container of multi-dimensional data for acquisition, visualization and sharing
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Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
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