Index Catalog // MDR

Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering

Description/Abstract:: We have conducted Auger depth profiling analyses of InP/GaInAsP multilayer specimens, in which the surface roughness was caused by the ar...
Keyword:: Auger depth profiling analysis, InP/GaInAsP multilayer specimens, surface roughness, atomic force microscope, and depth resolution function
Material/Specimen:: InP/GaInAsP multilayer specimens
Resource Type:: Article
Author:: OGIWARA, Toshiya and TANUMA, Shigeo
Journal:: Journal of The Surface Science Society of Japan
Date Uploaded:: 01/10/2021
Date Modified:: 01/10/2021

Monte Carlo tree search for materials design and discovery

Description/Abstract:: Materials design and discovery can be represented as selecting the optimal structure from a space of candidates that optimizes a target p...
Keyword:: Materials design and discovery
Resource Type:: Article
Author:: Shiomi, Junichiro, Ju, Shenghong, Dieb, Thaer M., and Tsuda, Koji
Journal:: MRS Communications
Date Uploaded:: 02/10/2020
Date Modified:: 16/10/2020

Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python

Description/Abstract:: New programs for fitting using an equivalent circuit model and data visualization of electrochemical impedance spectroscopy were develope...
Keyword:: data visualization, electrochemical impedance, free software, and model fitting
Resource Type:: Article, Software or Program Code, and Video
Author:: SUZUKI, Tohru S. and KOBAYASHI, Kiyoshi
Journal:: Electrochemistry
Date Uploaded:: 08/02/2021
Date Modified:: 10/02/2021

Optical fuse by carbon-coated TeO2 glass segment inserted in silica glass optical fiber circuit

Description/Abstract:: Excessive-light-induced melt down was observed in a carbon-coated TeO2 glass segment formed between a pair of optical fiber end-faces. T...
Keyword:: carbon, hybrid device, optical fiber, optical fuse, and tellurium oxide glass
Resource Type:: Article
Creator:: INOUE, Satoru and TODOROKI, Shin-ichi
Journal:: Jpn. J. Appl. Phys.
Date Uploaded:: 05/02/2020
Date Modified:: 15/06/2020

Mechanochromism of dynamic disulfide bonds as a chromophoric indicator of adhesion strength for epoxy adhesive

Description/Abstract:: We demonstrated that the introduction of disulfide bonds into epoxy adhesive could be used as a facile chromophoric indicator to predict ...
Keyword:: Adhesive
Resource Type:: Article
Author:: TSAI, Hsing-Ying, NAKAMURA, Yasuyuki, HU, Wei-Hsun, FUJITA, Takehiro, and NAITO, Masanobu
Journal:: Materials Advances
Date Uploaded:: 17/11/2021
Date Modified:: 01/12/2021

Structure and pressure inside Xe nanoparticles embedded in Al

Resource Type:: Article
Author:: Iakoubovskii, NIMS
Journal:: Physical Review B
Date Modified:: 14/06/2020

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Description/Abstract:: We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:: Auger Depth Profiling analysis, HfO2/Si, and Ultra Low Angle Incidence Ion Beam
Material/Specimen:: HfO2
Resource Type:: Article
Author:: Yoshikawa, Hideki, Ogiwara, Toshiya, and Nagata, Takahiro
Journal:: Journal of Surface Analysis
Date Uploaded:: 25/05/2021
Date Modified:: 26/05/2021

Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Description/Abstract:: ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:: AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor
Resource Type:: Article
Author:: TANUMA, Shigeo
Journal:: Surface and Interface Analysis
Date Uploaded:: 08/10/2020
Date Modified:: 01/07/2021

Object-oriented virtual sample library: a container of multi-dimensional data for acquisition, visualization and sharing

Description/Abstract:: Combinatorial methods bring about enormous data not only in size but also in dimension. To handle multi-dimensional data easily, a conce...
Keyword:: combinatorial research, data management, object-oriented programming, and scripting language
Resource Type:: Article
Creator:: TODOROKI, Shin-ichi
Journal:: Measurement Science & Technology
Date Uploaded:: 05/02/2020
Date Modified:: 15/06/2020

Arイオンスパッタリングされた各種化合物半導体表面のSEM観察

Description/Abstract:: 各種化合物半導体の表面をArイオンでスパッタリングして，その表面のSEM観察を行なった．そして，イオンスパッタリング時の試料温度および試料回転の有無と表面形状の関係を系統的に調べた．その結果，表面あれはスパッタリングされた表面全体に生成する場合とコーン状の突起物がランダムに...
Keyword:: compound semiconductor, surface observation using a scanning electron microscope, and argon ion sputtering
Material/Specimen:: InP, InSb, InAs, GaAs, GaSb, and GaP
Resource Type:: Article
Author:: Ogiwara, Toshiya and Tanuma, Shigeo
Journal:: Journal of Surface Analysis
Date Uploaded:: 28/05/2021
Date Modified:: 04/06/2021

Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering

Monte Carlo tree search for materials design and discovery

Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python

Optical fuse by carbon-coated TeO2 glass segment inserted in silica glass optical fiber circuit

Mechanochromism of dynamic disulfide bonds as a chromophoric indicator of adhesion strength for epoxy adhesive

Structure and pressure inside Xe nanoparticles embedded in Al

Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Object-oriented virtual sample library: a container of multi-dimensional data for acquisition, visualization and sharing

Arイオンスパッタリングされた各種化合物半導体表面のSEM観察

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