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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Thermally Stable Mesoporous Poly(ether sulfone) Monoliths with Nanofiber Network Structures
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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Automatic Extraction of Materials and Properties from Superconductors Scientific Literature
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[Research Highlights Vol.56] How Do Neuromorphic Nanowire Networks Find Routes to Convey Signals?
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[Research Highlights Vol.1] Atomic Nano-Switches Emulate Human Memory
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[Research Highlights Vol.2] High-Performance Thin Film Boost for Electronics Research
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[Research Highlights Vol.3] Bone tissue engineering: Attaching proteins for better regeneration
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[Research Highlights Vol.4] On-Demand Synaptic Electronics: Circuits that learn and forget
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[Research Highlights Vol.5] Detecting caesium with naked eyes
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