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Generating 3D voxelized architected materials using 3D conditional generative adversarial network
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Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
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Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
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SuperCon RDF Ver. 1.1
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Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
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XAFS spectrum of Nickel(II) oxide
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XAFS spectrum of Nickel(II) oxide
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XAFS spectrum of Lithium cobalt oxide
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XAFS spectrum of Lithium cobalt oxide
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XAFS spectrum of Titanium(IV) oxide
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XAFS spectrum of Titanium(IV) oxide
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XAFS spectrum of Titanium(IV) oxide
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XAFS spectrum of Calcium hydroxide
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XAFS spectrum of Potassium chloride
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XAFS spectrum of Potassium chloride
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XAFS spectrum of Sodium chloride
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XAFS spectrum of Potassium sulfate
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XAFS spectrum of Iron(III) phosphate
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XAFS spectrum of Nickel(II) oxide
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XAFS spectrum of Nickel(II) oxide
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