Search Constraints
« Previous |
1 - 50 of 2,579
|
Next »
Search Results
Select an image to start the slideshow
Optical constants of MgxZn1-xO
1 of 50
Dataset of La(Fe,Si)13-based magnetocaloric alloys
2 of 50
Original dataset for ID 238 70mol%MgO-30mol%SiO2 in Thermophysical Property Database
3 of 50
Original dataset for ID 237 66.7mol%MgO-33.3mol%SiO2 in Thermophysical Property Database
4 of 50
Original dataset for ID 236 60mol%MgO-40mol%SiO2 in Thermophysical Property Database
5 of 50
Original dataset for ID 235 50mol%MgO-50mol%SiO2 in Thermophysical Property Database
6 of 50
Original dataset for ID 234 40mol%MgO-60mol%SiO2 in Thermophysical Property Database
7 of 50
Original dataset for ID 233 30mol%MgO-70mol%SiO2 in Thermophysical Property Database
8 of 50
Original dataset for ID 232 18.5mol%Y2O3-81.5mol%Al2O3 in Thermophysical Property Database
9 of 50
Original dataset for ID 231 23.5mol%Y2O3-76.5mol%Al2O3 in Thermophysical Property Database
10 of 50
Original dataset for ID 230 37.5mol%Y2O3-62.5mol%Al2O3 in Thermophysical Property Database
11 of 50
Original dataset for ID 229 45mol%Y2O3-55mol%Al2O3 in Thermophysical Property Database
12 of 50
Original dataset for ID 228 50mol%Y2O3-50mol%Al2O3 in Thermophysical Property Database
13 of 50
Original dataset for ID 227 66.7mol%Y2O3-33.3mol%Al2O3 in Thermophysical Property Database
14 of 50
NITE 高分子破壊データベース スクラッチ試験
15 of 50
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
16 of 50
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
17 of 50
Original dataset for ID 200 Ti in Thermophysical Property Database
18 of 50
Original dataset for ID 201 Cr-Co-Mo-LC in Thermophysical Property Database
19 of 50
Original dataset for ID 202 Cr-Co-Mo-LC in Thermophysical Property Database
20 of 50
Original dataset for ID 203 Cr-Co-Mo-HC in Thermophysical Property Database
21 of 50
Original dataset for ID 204 Cr-Co-Mo-LC in Thermophysical Property Database
22 of 50
Original dataset for ID 205 Al2O3 in Thermophysical Property Database
23 of 50
Original dataset for ID 206 Tb2O3 in Thermophysical Property Database
24 of 50
Original dataset for ID 207 Tm2O3 in Thermophysical Property Database
25 of 50
Original dataset for ID 208 Ga2O3 in Thermophysical Property Database
26 of 50
Original dataset for ID 210 Ni-25at%Ti in Thermophysical Property Database
27 of 50
Original dataset for ID 211 Ni-50at%Ti in Thermophysical Property Database
28 of 50
Original dataset for ID 212 Ni-75at%Ti in Thermophysical Property Database
29 of 50
Original dataset for ID 213 Ni-75at%Ti in Thermophysical Property Database
30 of 50
Original dataset for ID 214 Lu2O3 in Thermophysical Property Database
31 of 50
Original dataset for ID 215 Yb2O3 in Thermophysical Property Database
32 of 50
Original dataset for ID 216 Ni-25at%Ti in Thermophysical Property Database
33 of 50
Original dataset for ID 217 Ni-50at%Ti in Thermophysical Property Database
34 of 50
Original dataset for ID 218 Ni-10at%Ti in Thermophysical Property Database
35 of 50
Original dataset for ID 219 Ni-10at%Ti in Thermophysical Property Database
36 of 50
Original dataset for ID 220 Ni-40at%Ti in Thermophysical Property Database
37 of 50
Original dataset for ID 221 Ni-40at%Ti in Thermophysical Property Database
38 of 50
Original dataset for ID 222 Ni-30at%Ti in Thermophysical Property Database
39 of 50
Original dataset for ID 223 Ni-30at%Ti in Thermophysical Property Database
40 of 50
Original dataset for ID 224 Ni-60at%Ti in Thermophysical Property Database
41 of 50
Original dataset for ID 225 Ni-60at%Ti in Thermophysical Property Database
42 of 50
Original dataset for ID 226 Y2O3 in Thermophysical Property Database
43 of 50
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
44 of 50
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
45 of 50
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
46 of 50
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
47 of 50
XAFS spectrum of ruthenium (IV) oxide
48 of 50
XAFS spectrum of ruthenium
49 of 50
XAFS spectrum of rhodium (III) oxide
50 of 50