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Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams

Description/Abstract:

The aberrations of the objective lens should be measured and adjusted to realize high spatial resolution in scanning transmission electro...

Keyword:

Aberration, Ronchigram, STEM, and alignment

Resource Type:

Article

Author:

Koji Kimoto and Kazuo Ishizuka

Journal:

Ultramicroscopy

Date Uploaded:

02/08/2022

Date Modified:

03/08/2022
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy

Description/Abstract:

Scientific instruments for material characterization have recently been improved to yield big data. For instance, scanning transmission e...

Keyword:

electron microscopy, four-dimensional scanning transmission electron microscopy, and non-negative matrix factorization

Resource Type:

Article

Author:

Fumihiko Uesugi, Shogo Koshiya, Jun Kikkawa, Takuro Nagai, Kazutaka Mitsuishi, and Koji Kimoto

Journal:

Ultramicroscopy

Date Uploaded:

02/08/2022

Date Modified:

03/08/2022